The profile of a plateau border near a vertical foam film

Autor: Hudales, J.B.M., Stein, H.N., Bloom, D.M., Wyn-Jones, E.

Publikováno v: The structure, dynamics and equilibrium properties of colloidal systems, 541-549
STARTPAGE=541;ENDPAGE=549;TITLE=The structure, dynamics and equilibrium properties of colloidal systems

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::0687340236eb3cfb15f6095e21e4708d
https://research.tue.nl/nl/publications/62dc5135-1382-410b-b138-1528c831f756

Delay of field collapse in photoconductive gaps fabricated on GaAs/AlGaAs MODFET material.

Autor: Sheridan, J.A., Nechay, B.A., Bloom, D.M., Solomon, P.M., Pao, Y.C.

Publikováno v: Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices & Circuits; 1993, p391-400, 10p

Microwave Measurements of GaAs Integrated Circuits Using Electrooptic Sampling.

Autor: Weingarten, K.J., Majidi-Ahy, R., Rodwell, M.J.W., Auld, B.A., Bloom, D.M.

Publikováno v: 1987 IEEE MTT-S International Microwave Symposium Digest; 1987, Issue 2, p877-880, 4p

Characterization of GaAs integrated circuits by direct electro-optic sampling.

Autor: Weingarten, K.J., Rodwell, M.J.W., Freeman, J.L., Diamond, S.K., Bloom, D.M.

Publikováno v: 1985 International Electron Devices Meeting; 1985, p479-482, 4p

GaAs Integrated Circuit Testing Using Electrooptic Sampling.

Autor: Weingarten, K.J., Rodwell, M.J.W., Bloom, D.M.

Publikováno v: IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices & Circuits, 1987 Proceedings; 1987, p35-44, 10p