Reflectivity and PDE of VUV4 Hamamatsu SiPMs in Liquid Xenon

Autor: Nakarmi, P., Ostrovskiy, I., Soma, A. K., Retiere, F., Kharusi, S. Al, Alfaris, M., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Blatchford, J., Breur, P. A., Brodsky, J. P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, G. F., Cao, L., Chambers, C., Chana, B., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Croix, A. De St., Der Mesrobian-Kabakian, A., DeVoe, R., Di Vacri, M. L., Dilling, J., Ding, Y. Y., Dolinski, M. J., Doria, L., Dragone, A., Echevers, J., Edaltafar, F., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fontaine, R., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E. V., Heffner, M., Hoppe, E. W., Hößle, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leach, K. G., Lenardo, B. G., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., Lv, P., MacLellan, R., Massacret, N., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D. C., Murray, K., Natzke, C. R., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, l J. L., Ortega, G. S., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rescia, S., Richman, M., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, St-Hilaire, G., Stekhanov, r V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Totev, T. I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J. -L., Wagenpfeil, M., Wager, T., Walent, M., Wang, Q., Ward, M., Watkins, J., Weber, M., Wei, W., Wen, L. J., Wichoski, U., Wu, S. X., Wu, W. H., Wu, X., Xia, Q., Yang, H., Yang, L., Zeldovich, O., Zhao, J., Zhou, Y., Ziegler, T.

Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter,

Externí odkaz: http://arxiv.org/abs/1910.06438

Formation of Nickel-Platinum Silicides on a Silicon Substrate: Structure, Phase Stability, and Diffusion from Ab initio Computations

Autor: Christensen, M., Eyert, V., Freeman, C., Wimmer, E., Jain, A., Blatchford, J., Riley, D., Shaw, J.

Publikováno v: J. Appl. Phys. 114, 033533 (2013)

The formation of Ni(Pt)silicides on a Si(001) surface is investigated using an ab initio approach. After deposition of a Ni overlayer alloyed with Pt, the calculations reveal fast diffusion of Ni atoms into the Si lattice, which leads initially to th

Externí odkaz: http://arxiv.org/abs/1308.2605

Formation of pre-silicide layers below Ni1−xPtxSi/Si interfaces

Autor: Thron, A.M., Pennycook, T.J., Chan, J., Luo, W., Jain, A., Riley, D., Blatchford, J., Shaw, J., Vogel, E.M., Hinkle, C.L., van Benthem, K.

Publikováno v: In Acta Materialia April 2013 61(7):2481-2488

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Empagliflozin in Patients Hospitalised for De Novo Versus Decompensated Chronic Heart Failure: Insights From the EMPULSE Trial

Autor: Teerlink, J., Voors, A., Collins, S., Kosiborod, M., Biegus, J., Ferreira, J., Nassif, M., Psotka, M., Tromp, J., Blatchford, J., Salsali, A., Kraus, B., Ponikowski, P., Angermann, C.

Publikováno v: In Heart, Lung and Circulation 2022 31 Supplement 3:S82-S83