Zobrazeno 1 - 10
of 137
pro vyhledávání: '"Blas, Garrido"'
Publikováno v:
IEEE Access, Vol 11, Pp 51260-51269 (2023)
Resistive switching (RS) devices are electronic components which exhibit a resistive state that can be adjusted to different nonvolatile levels via electrical stressing, fueling the development of future resistive memories (ReRAM) and enabling innova
Externí odkaz:
https://doaj.org/article/b1d5e91b186b4355a71ed8261e79e2da
Autor:
Sergio González, Giovanni Vescio, Juan Luis Frieiro, Alina Hauser, Flavio Linardi, Julian López‐Vidrier, Marek Oszajca, Sergi Hernández, Albert Cirera, Blas Garrido
Publikováno v:
Advanced Materials Interfaces, Vol 10, Iss 15, Pp n/a-n/a (2023)
Abstract Transparent Conducting Oxides (TCOs) are an enticing family of optoelectronic materials which have been proven to increase efficiency when incorporated into perovskite light emitting diode (PE‐LED) and organic OLED architectures as transpo
Externí odkaz:
https://doaj.org/article/54b18eb98bbe47b0a6771cb611e19cc0
Autor:
Alfredo Morales-Sánchez, Karla Esther González-Flores, Sergio Alfonso Pérez-García, Sergio González-Torres, Blas Garrido-Fernández, Luis Hernández-Martínez, Mario Moreno-Moreno
Publikováno v:
Nanomaterials, Vol 13, Iss 6, p 986 (2023)
In this work, we report the digital and analog resistive-switching (RS) characteristics in a memristor based on silicon nanocrystals (Si-NCs) integrated into a complementary metal-oxide-semiconductor (MOS) structure. Si-NCs with a diameter of 5.48 ±
Externí odkaz:
https://doaj.org/article/54d56252214a4e8fbae4d38f1784c62f
Autor:
Kaichen Zhu, Giovanni Vescio, Sergio González-Torres, Julià López-Vidrier, Juan Luis Frieiro, Sebastian Pazos, Xu Jing, Xu Gao, Sui-Dong Wang, Joaquín Ascorbe-Muruzábal, Juan A. Ruiz-Fuentes, Albert Cirera, Blas Garrido, Mario Lanza
Publikováno v:
Nanoscale.
Inkjet-printed h-BN memristors exhibit multiple stochastic phenomena that are very attractive for use as entropy sources in electronic circuits for data encryption. The high variability can be exploited to create unique and unpredictable patterns.
Autor:
Rafael Sánchez, Andrés Gualdrón-Reyes, Sergio González-Torres, Jesús Sanchez-Diaz, Alex Villanueva-Antoli, Giovanni Vescio, Gayathri Mathiazhagan, Marek Oszajca, Alina Hauser, Sergi Hernández, Iván Mora-Seró, Albert Cirera, Blas Garrido
Publikováno v:
Proceedings of the MATSUS23 & Sustainable Technology Forum València (STECH23).
Autor:
Blas Garrido, Giovanni Vescio, Gayathri Mathiazhagan, Sergi Hernández, Sergio González, Joshua Diago, Albert Cirera
Publikováno v:
Proceedings of the Sustainable Metal-halide perovskites for photovoltaics, optoelectronics and photonics.
Publikováno v:
Pharmaceutical Care España, Vol 19, Iss 4 (2017)
Introducción: La baja adherencia conlleva importantes problemas y es importante medirla para abordar intervenciones farmacéuticas para mejorarla. El test de Morisky-Green es la principal herramientas para ello, pero en nuestro medio hay pocos estud
Externí odkaz:
https://doaj.org/article/58386314da124685897de5f9c3f1cdda
Autor:
Giovanni Vescio, Jesus Sanchez-Diaz, Juan Luis Frieiro, Rafael S. Sánchez, Sergi Hernández, Albert Cirera, Iván Mora-Seró, Blas Garrido
Publikováno v:
Repositori Universitat Jaume I
Universitat Jaume I
Universitat Jaume I
Lead-free PEA2SnI4-based perovskite LEDs are successfully inkjet-printed on rigid and flexible substrates. Red-emitting devices (λmax = 633 nm) exhibit, under ambient conditions, a maximum external quantum efficiency (EQEmax) of 1% with a related br
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5217bbe54b3c52a84b627ad44e2dff25
Autor:
Blas Garrido Fernández
Publikováno v:
Proceedings of the nanoGe Fall Meeting 2021.
Autor:
Frank Güell, Michel Vergnat, Hervé Rinnert, Paulina R. Martínez-Alanis, Blas Garrido, Adolf Canillas, Oriol Arteaga
Publikováno v:
Applied optics. 60(15)
The dielectric function of V O x and V 2 O 5 thin films is determined with the use of a spectroscopic Mueller matrix ellipsometer from 1.5 to 5.0 eV. The complex dielectric function of the films is calculated using the measured Mueller matrices filte