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Machine Learning Support for Fault Diagnosis of System-On-Chip. [elektronicky zdroj]

Autor: Girard, Patrick

Externí odkaz: Kolekce e-knih KNAV (Registrovani uzivatele: plny text online 5 minut, dalsi pristup na vyzadani. Registered users: full text online 5 minutes, further access on request.)

Analysis of packaging effects on the performance of the microflown

Autor: van Honschoten, J.W., Yntema, D.R., Dijkstra, M., Svetovoy, V.B., Wiegerink, R.J., Elwenspoek, M., Blanton, Shawn, Bosseboeuf, Alain

Publikováno v: Proceedings of DTIP of MEMS & MOEMS 2006: design, test, integration and packaging of MEMS-MOEMS 2006 : 26-28 April 2006, Stresa, Lago Maggiore, Italy, 1-6
STARTPAGE=1;ENDPAGE=6;TITLE=Proceedings of DTIP of MEMS & MOEMS 2006

The packaging effects of an acoustic particle velocity sensor have been analysed both analytically and by means of finite volume simulations on fluid dynamics. The results are compared with acoustic experiments that show a large magnification of the

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::2ede0af13e33c706f3e1877046256a5b
https://research.utwente.nl/en/publications/analysis-of-packaging-effects-on-the-performance-of-the-microflown(9b3a2668-8869-4aaa-85a7-2341bab07e25).html

To DFM or not to DFM?

Autor: Tam, Wing Chiu, Blanton, Shawn

Publikováno v: 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC); Jun2011, p65-70, 6p

Extracting Defect Density and Size Distribution from Product ICs.

Autor: Nelson, Jeffrey E., Zanon, Thomas, Brown, Jason G., Osei Poku, Blanton, (Shawn), Maly, Wojciech, Benware, Brady, Schuermyer, Chris

Publikováno v: IEEE Design & Test of Computers; Sep/Oct2006, Vol. 23 Issue 5, p390-400, 11p, 8 Black and White Photographs, 2 Diagrams, 2 Charts, 13 Graphs