Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Blackwell Don Raymond"'
Autor:
Michael Simcoe, Uwe Paul Schroeder, Sriram Madhavan, Gail Katzman, Rais Huda, Blackwell Don Raymond, Yongfu Li, Lynn T.-N. Wang, Ahmed Abdulghany, Thomas Hermann, Mckay Thomas G, Janam Bakshi, Zhao Chuan Lee, Vikas Mehrotra
Publikováno v:
Design-Process-Technology Co-optimization for Manufacturability XIII.
A suite of DFM enablement is enhanced to address the unique needs of analog, RF, and mmWave designs in the custom design flow. The DFM rules and patterns are made stricter beyond baseline requirements, and new DFM rules and patterns are added to furt