Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Bjorn Van Bockel"'
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 70:1-10
Performance degradation of standard time-to-digital converters (TDCs) is inevitable due to the effects of ionizing radiation. In this article, the tradeoffs of different mitigation techniques for TDC architectures are presented. As the effect of radi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e59b10dfd2720251e4bc8b4a9ab7eaf2
https://doi.org/10.1109/tim.2021.3100355
https://doi.org/10.1109/tim.2021.3100355
Publikováno v:
IEEE Transactions on Nuclear Science. 66:282-289
This paper presents a novel radiation monitor that is based on a custom static random access memory (SRAM) application-specified integrated circuit. Its sensitivity is adjustable through its core supply voltage and the radiation monitoring is based o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::26a60a95b1a9181bc4ffc559204bd78f
https://doi.org/10.1109/tns.2018.2885693
https://doi.org/10.1109/tns.2018.2885693
Publikováno v:
Scopus-Elsevier
This paper presents a radiation tolerant single-shot time-to-digital converter (TDC) with a resolution of 4 ps, fabricated in a 65 nm Complementary Metal Oxide Semiconductor (CMOS) technology. To achieve the low resolution, the delay elements are imp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8b54a093d3c582051dc3309d623bf8df
https://lirias.kuleuven.be/handle/123456789/656268
https://lirias.kuleuven.be/handle/123456789/656268
Publikováno v:
Electronics, Vol 8, Iss 5, p 558 (2019)
Electronics
Volume 8
Issue 5
Electronics
Volume 8
Issue 5
This article presents a radiation tolerant single-shot time-to-digital converter (TDC) with a resolution of 15.6 ps, fabricated in a 65 nm complementary metal oxide semiconductor (CMOS) technology. The TDC is based on a multipath pseudo differential
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::46a82b433bf07fee102580cbc0ec3342
https://doi.org/10.3390/electronics8050558
https://doi.org/10.3390/electronics8050558
Publikováno v:
IEEE Transactions on Nuclear Science
© 1963-2012 IEEE. This paper presents a novel radiation monitor that is based on a custom static random access memory (SRAM) application-specified integrated circuit. Its sensitivity is adjustable through its core supply voltage and the radiation mo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::26a60a95b1a9181bc4ffc559204bd78f
Publikováno v:
Scopus-Elsevier
This paper proposes the simulation results of a 1 GHz Delay Locked Loop (DLL) designed in a 65 nm CMOS technology. The circuit was designed for harsh environments, in particular ionizing radiation. A novel phase detector consisting of an improved ban
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e239fab2d3db8395e4668bc491a4dbd5
http://www.scopus.com/inward/record.url?eid=2-s2.0-85072856485&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-85072856485&partnerID=MN8TOARS