A generic type system for higher-order Ψ-calculi

Autor: Hüttel, Hans, Lybech, Stian, Bendixen, Alex R., Bojesen, Bjarke B.

Publikováno v: In Information and Computation October 2024 300

Modified intention-to-treat analysis did not bias trial results

Autor: Dossing, Anna, Tarp, Simon, Furst, Daniel E., Gluud, Christian, Wells, George A., Beyene, Joseph, Hansen, Bjarke B., Bliddal, Henning, Christensen, Robin

Publikováno v: In Journal of Clinical Epidemiology April 2016 72:66-74

Saturation limit and p-type thermoelectric properties of RuAs2−xGex.

Autor: Fischer, Karl F. F., Demant, Bjarke B., Jørgensen, Lasse R., Iversen, Bo B.

Publikováno v: Applied Physics Letters; 4/3/2023, Vol. 122 Issue 14, p1-6, 6p

Surface-Controlled Crystal Alignment of Naphthyl End-Capped Oligothiophene on Graphene: Thin-Film Growth Studied by in Situ X-ray Diffraction

Autor: Martin Hodas, Mathias K. Huss-Hansen, Bjarke B. E. Jensen, Luciana Tavares, Jakub Hagara, Arne Lützen, Frank Schreiber, Jakob Kjelstrup-Hansen, Matti Knaapila, Eva Majkova, Andreas Osadnik, Peter Siffalovic, Nada Mrkyvkova

Publikováno v: Huss-Hansen, M K, Hodas, M, Mrkyvkova, N, Hagara, J, Jensen, B B E, Osadnik, A, Lützen, A, Majková, E, Siffalovic, P, Schreiber, F, Tavares, L, Kjelstrup-Hansen, J & Knaapila, M 2020, ' Surface-Controlled Crystal Alignment of Naphthyl End-Capped Oligothiophene on Graphene: Thin-Film Growth Studied by in Situ X-ray Diffraction ', Langmuir, vol. 36, no. 8, pp. 1898-1906 . https://doi.org/10.1021/acs.langmuir.9b03467
Huss-Hansen, M, Hodas, M, Mrkyvkova, N, Hagara, J, Jensen, B B E, Osadnik, A, Lützen, A, Majková, E, Siffalovic, P, Schreiber, F, Tavares, L, Kjelstrup-Hansen, J & Knaapila, M 2020, ' Surface-Controlled Crystal Alignment of Naphthyl End-Capped Oligothiophene on Graphene: Thin-Film Growth Studied by In Situ X-ray Diffraction ', Langmuir, vol. 36, no. 8, pp. 1898-1906 . https://doi.org/10.1021/acs.langmuir.9b03467

We report on the microstructure, morphology, and growth of 5,5′-bis(naphth-2-yl)-2,2′-bithiophene (NaT2) thin films deposited on graphene, characterized by grazing incidence X-ray diffraction (GIXRD) and complemented by atomic force microscopy (A

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d4598b03c45d19ed02b3488f4b751751
https://pubmed.ncbi.nlm.nih.gov/32027509

[Imaging of the spine in cases of low back pain]

Autor: Bjarke B, Hansen, Philip, Hansen, Cecilie L, Nordberg, Mikael, Boesen

Publikováno v: Ugeskrift for laeger. 180(16)

Imaging of the spine is extensively applied in the assessment of patients with low back pain, who often expect imaging procedures to be undertaken. However, the majority of conventional imaging techniques have questionable precision in identifying th

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid________::57a610b07f1fd3d75b2128e20328adb1
https://pubmed.ncbi.nlm.nih.gov/29690989