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Different sensing mechanisms in single wire and mat carbon nanotubes chemical sensors

Autor: Neumann, P. L., Obreczán, V. I., Dobrik, G., Kertész, K., Horváth, E., Lukács, I. E., Biró, L. P., Horváth, Z. E.

Chemical sensing properties of single wire and mat form sensor structures fabricated from the same carbon nanotube (CNT) materials have been compared. Sensing properties of CNT sensors were evaluated upon electrical response in the presence of five v

Externí odkaz: http://arxiv.org/abs/1407.6435

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Mapping of functionalized regions on carbon nanotubes by scanning tunneling microscopy

Autor: Nemes-Incze, P., Kónya, Z., Kiricsi, I., Pekker, Á., Horváth, Z. E., Kamarás, K., Biró, L. P.

Publikováno v: J. Phys. Chem. C. 115 (2011) 3229-3235

Scanning tunneling microscopy (STM) gives us the opportunity to map the surface of functionalized carbon nanotubes in an energy resolved manner and with atomic precision. But this potential is largely untapped, mainly due to sample stability issues w

Externí odkaz: http://arxiv.org/abs/1009.1290

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Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy

Autor: Nemes-Incze, P., Osvath, Z., Kamaras, K., Biro, L. P.

Publikováno v: CARBON, Volume: 46, Issue: 11, Pages: 1435-1442, Published: SEP 2008

Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon oxide surfaces. It is a convenient tool to quickly determine the thic

Externí odkaz: http://arxiv.org/abs/0812.0690

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