Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Binyu Yin"'
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 11, Pp 303-310 (2023)
Process variations (PV), including global variation (GV) and local variation (LV), have become one of the major issues in advanced technologies, which is crucial for circuit performance and yield. However, developing a mature and physics-based model
Externí odkaz:
https://doaj.org/article/f521b6838a3c44e29d9bc4875b3c1969
Publikováno v:
2022 IEEE 25th International Conference on Intelligent Transportation Systems (ITSC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76f48a196a8590e581773d4709fc630b
https://doi.org/10.1109/itsc55140.2022.9921964
https://doi.org/10.1109/itsc55140.2022.9921964
Publikováno v:
2022 IEEE Silicon Nanoelectronics Workshop (SNW).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da16cd4cafe4badd3b18a84018fc3bd2
https://doi.org/10.1109/snw56633.2022.9889011
https://doi.org/10.1109/snw56633.2022.9889011