Zobrazeno 1 - 10
of 208
pro vyhledávání: '"Binari, S.C."'
Publikováno v:
In Solid State Electronics August 2013 86:17-21
Autor:
Storm, D.F., Katzer, D.S., Deen, D.A., Bass, R., Meyer, D.J., Roussos, J.A., Binari, S.C., Paskova, T., Preble, E.A., Evans, K.R.
Publikováno v:
In Solid State Electronics 2010 54(11):1470-1473
Autor:
Storm, D.F., Katzer, D.S., Roussos, J.A., Mittereder, J.A., Bass, R., Binari, S.C., Zhou, Lin, Smith, David J., Hanser, D., Preble, E.A., Evans, K.R.
Publikováno v:
In Journal of Crystal Growth 2007 305(2):340-345
Autor:
Storm, D.F., Katzer, D.S., Roussos, J.A., Mittereder, J.A., Bass, R., Binari, S.C., Hanser, D., Preble, E.A., Evans, K.R.
Publikováno v:
In Journal of Crystal Growth 2007 301:429-433
Publikováno v:
In Journal of Crystal Growth 2003 251(1):481-486
Publikováno v:
In Microelectronics Reliability 2002 42(7):1021-1028
Autor:
Ancona, M.G., Binari, S.C.
Publikováno v:
2011 International Conference on Simulation of Semiconductor Processes & Devices (SISPAD); 2011, p111-114, 4p
Autor:
Mittereder, J.A., Cronk, N.S., Binari, S.C., Via, G.D., Fanning, D., Tserng, H., Saunier, P., Decker, K., Beam, E.
Publikováno v:
2009 Reliability of Compound Semiconductors Digest (ROCS); 2009, p103-108, 6p
Autor:
Mittereder, J.A., Binari, S.C., Klein, P.B., Roussos, J.A., Katzer, D.S., Storm, D.F., Koleske, D.D., Wickenden, A.E., Henry, R.L.
Publikováno v:
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual; 2003, p320-323, 4p
Publikováno v:
2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278); 2002, p1823-1826, 4p