Contact Hole Printing in Binary Mask by FLEX Technique.

Autor: Cheong Yew Shun, Ko Bong Sang, Bin Manaf, M.J., Ibrahim, K., Jamal, Z.A.Z.

Publikováno v: 2006 IEEE International Conference on Semiconductor Electronics; 2006, p434-437, 4p

A Study of Center Field Stripe Yield Loss Mechanism.

Autor: Maurya, A., Bin Manaf, M.J., Abdul Rahman, Z., Sim Jit-Shen, Chong Seng Ong, Thung Beng Joo

Publikováno v: 2006 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2006, p179-182, 4p