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pro vyhledávání: '"Bijlsma, Sipke J."'
Autor:
Bijlsma, S.J., Bijlsma, Sipke J., van Kranenburg, H., Nieuwesteeg, K.J.B.M., Pitt, Michael G., Verweij, Jan F., Verweij, J.F.
Publikováno v:
IEEE Transactions on Electron Devices, 43(9), 1592-1601. IEEE
Electrical breakdown, both intrinsic and extrinsic, of thin film diodes used as switches in active matrix addressed liquid crystal displays has been studied using electrical measurements, thermal measurements, thermal 3D simulations, electrical simul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::968f2b6f7e6fcc534494d0b1a62515c7
https://research.utwente.nl/en/publications/67926c31-bb5f-4032-82fb-54c2fd85944d
https://research.utwente.nl/en/publications/67926c31-bb5f-4032-82fb-54c2fd85944d
