Zobrazeno 1 - 10
of 87
pro vyhledávání: '"Biesemans, Serge"'
Autor:
Paul, Abhijeet, Tettamanzi, Giuseppe C., Lee, Sunhee, Mehrotra, Saumitra, Colleart, Nadine, Biesemans, Serge, Rogge, Sven, Klimeck, Gerhard
Channel conductance measurements can be used as a tool to study thermally activated electron transport in the sub-threshold region of state-of-art FinFETs. Together with theoretical Tight-Binding (TB) calculations, this technique can be used to under
Externí odkaz:
http://arxiv.org/abs/1102.0140
Autor:
Tettamanzi, Giuseppe Carlo, Paul, Abhijeet, Lee, Sunhee, Mehrotra, Saumitra R., Collaert, Nadine, Biesemans, Serge, Klimeck, Gerhard, Rogge, Sven
The presence of interface states at the MOS interface is a well-known cause of device degradation. This is particularly true for ultra-scaled FinFET geometries where the presence of a few traps can strongly influence device behavior. Typical methods
Externí odkaz:
http://arxiv.org/abs/1011.2582
Autor:
Tettamanzi, Giuseppe C., Paul, Abhijeet, Lansbergen, Gabriel P., Verduijn, Jan, Lee, Sunhee, Collaert, Nadine, Biesemans, Serge, Klimeck, Gerhard, Rogge, Sven
Publikováno v:
IEEE Electron Device Letters 21 (2010) 150
Thermally activated sub-threshold transport has been investigated in undoped triple gate MOSFETs. The evolution of the barrier height and of the active cross-section area of the channel as a function of gate voltage has been determined. The results o
Externí odkaz:
http://arxiv.org/abs/1003.5441
Autor:
Sato-Iwanaga, Junko, Inoue, Akira, Sorada, Haruyuki, Takagi, Takeshi, Rothschild, Aude, Loo, Roger, Biesemans, Serge, Ito, Choshu, Liu, Yang, Dutton, Robert W., Tsuchiya, Hideaki
Publikováno v:
In Solid State Electronics January 2014 91:1-8
Autor:
Seiji Nagahara, Cong Que Dinh, Gosuke Shiraishi, Yuya Kamei, Nafus, Kathleen, Yoshihiro Kondo, Carcasi, Michael, Yukie Minekawa, Hiroyuki Ide, Yuichi Yoshida, Kosuke Yoshihara, Ryo Shimada, Masaru Tomono, Kazuhiro Takeshita, Biesemans, Serge, Hideo Nakashima, De Simone, Danilo, Petersen, John S., Foubert, Philippe, De Bisschop, Peter
Publikováno v:
Proceedings of SPIE; 1/23/2019, Vol. 10960, p1-15, 15p
Autor:
Cong Que Dinh, Seiji Nagahara, Gousuke Shiraishi, Yukie Minekawa, Yuya Kamei, Carcasi, Michael, Hiroyuki Ide, Yoshihiro Kondo, Yuichi Yoshida, Kosuke Yoshihara, Ryo Shimada, Masaru Tomono, Teruhiko Moriya, Kazuhiro Takeshita, Nafus, Kathleen, Biesemans, Serge, Petersen, John S., De Simone, Danilo, Foubert, Philippe, De Bisschop, Peter
Publikováno v:
Proceedings of SPIE; 1/20/2019, Vol. 10957, p109571O-1-109571O-10, 10p
Autor:
Alagna, Paolo, Conley, Will, Rechtsteiner, Greg, Nafus, Kathleen, Biesemans, Serge, Lorusso, Gian Francesco
Publikováno v:
Proceedings of SPIE; 1/15/2018, Vol. 10587, p1-11, 11p
Autor:
Goldberg, Kenneth A., Dinh, Cong Que, Nagahara, Seiji, Shiraishi, Gousuke, Minekawa, Yukie, Kamei, Yuya, Carcasi, Michael, Ide, Hiroyuki, Kondo, Yoshihiro, Yoshida, Yuichi, Yoshihara, Kosuke, Shimada, Ryo, Tomono, Masaru, Moriya, Teruhiko, Takeshita, Kazuhiro, Nafus, Kathleen, Biesemans, Serge, Petersen, John S., De Simone, Danilo, Foubert, Philippe, De Bisschop, Peter, Vandenberghe, Geert, Stock, Hans-Jürgen, Meliorisz, Balint
Publikováno v:
Proceedings of SPIE; March 2019, Vol. 10957 Issue: 1 p109571O-109571O-10, 10847540p
Autor:
Gronheid, Roel, Sanders, Daniel P., Nagahara, Seiji, Dinh, Cong Que, Shiraishi, Gosuke, Kamei, Yuya, Nafus, Kathleen, Kondo, Yoshihiro, Carcasi, Michael, Minekawa, Yukie, Ide, Hiroyuki, Yoshida, Yuichi, Yoshihara, Kosuke, Shimada, Ryo, Tomono, Masaru, Takeshita, Kazuhiro, Biesemans, Serge, Nakashima, Hideo, De Simone, Danilo, Petersen, John S., Foubert, Philippe, De Bisschop, Peter, Vandenberghe, Geert, Stock, Hans-Jürgen, Meliorisz, Balint
Publikováno v:
Proceedings of SPIE; March 2019, Vol. 10960 Issue: 1 p109600A-109600A-15, 10850416p
Autor:
Goldberg, Kenneth A., Felix, Nelson M., Carcasi, Michael, Nagahara, Seiji, Shiraishi, Gosuke, Minekawa, Yukie, Ide, Hiroyuki, Kondo, Yoshihiro, Yoshihara, Kosuke, Tomono, Masaru, Shimada, Ryo, Takeshita, Kazuhiro, Moriya, Teruhiko, Kamei, Yuya, Nafus, Kathleen, Biesemans, Serge, Nakashima, Hideo, Hori, Masafumi, Maruyama, Ken, Nakagawa, Hisashi, Nagai, Tomoki, Dei, Satoshi, Miyake, Masayuki, Naruoka, Takehiko, Shima, Motoyuki, Vandenberghe, Geert, De Simone, Danilo, Foubert, Philippe, Petersen, John S., Oshima, Akihiro, Tagawa, Seiichi
Publikováno v:
Proceedings of SPIE; March 2018, Vol. 10583 Issue: 1 p105831M-105831M-14, 10477284p