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Autor:
Kevin E. Bennet, Kendall H. Lee, Jonathan R. Tomshine, Emma M. Sundin, James N. Kruchowski, William G. Durrer, Bianca M. Manciu, Abbas Kouzani, Felicia S. Manciu
Publikováno v:
Materials, Vol 8, Iss 5, Pp 2782-2793 (2015)
Analysis of the induced stress on undoped and boron-doped diamond (BDD) thin films by confocal Raman microscopy is performed in this study to investigate its correlation with sample chemical composition and the substrate used during fabrication. Know
Externí odkaz:
https://doaj.org/article/1312e074aef04c0e8a48c075fb59a7ba