Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Bhat, Aaditya"'
Robust atomic resolution structural characterization of point defects in 3D is a longstanding challenge for electron microscopy. Here, we evaluate multislice electron ptychography as a tool to carry out 3D atomic resolution characterization of point
Externí odkaz:
http://arxiv.org/abs/2409.07663
Ion implantation is widely used to dope semiconductors for electronic device fabrication, but techniques to quantify point defects and induced damage are limited. While several techniques can measure dopant concentration profiles with high accuracy,
Externí odkaz:
http://arxiv.org/abs/2409.06987
Autor:
Bhat, Aaditya, Jain, Shrey
CLIP (Contrastive Language-Image Pre-training) models developed by OpenAI have achieved outstanding results on various image recognition and retrieval tasks, displaying strong zero-shot performance. This means that they are able to perform effectivel
Externí odkaz:
http://arxiv.org/abs/2301.07315
Publikováno v:
Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p
Publikováno v:
Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p
Autor:
Shelton, Crystal J., Kim, Alice, Hassan, Anthony M., Bhat, Aaditya, Barnello, Jeff, Castro, Carl A.
Publikováno v:
Journal of Military, Veteran & Family Health; 2020 Supplement, Vol. 6, p50-57, 8p
Publikováno v:
Microscopy & Microanalysis; 2023 Supplement, p1737-1737, 1p