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pro vyhledávání: '"Bharath Vembu"'
Autor:
R. Vetury, Bharath Vembu, Shawn R. Gibb, David Hepper, D. S. Green, Daniel Jin, L. Thomas Beechem, Jeffrey B. Shealy, Samuel Graham
Publikováno v:
physica status solidi c. 5:2026-2029
GaN HEMT reliability evaluation in a typical Arrhenius manner requires establishing peak junction temperature for a particular stress condition. Several new techniques have yielded promising results toward establishing peak temperature for these devi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f37afbccc74a4c117c7d83ed376a72ae
https://doi.org/10.1002/pssc.200778722
https://doi.org/10.1002/pssc.200778722
