Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Bertrand Le Gratiet"'
Autor:
Thibaut Bourguignon, Bertrand Le Gratiet, Jonathan Pradelles, Sébastien Bérard-Bergery, Charles Valade, Nivea G. Schuch, Nicolas Possémé
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f91126c80f0f7f161537dea4c560a45
https://doi.org/10.1117/12.2657914
https://doi.org/10.1117/12.2657914
Autor:
Bertrand Le-Gratiet, Serap A. Savari
Publikováno v:
Journal of Micro/Nanopatterning, Materials, and Metrology. 21
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c548bfcbc3906830a8d78c570b8fc742
https://doi.org/10.1117/1.jmm.21.4.041601
https://doi.org/10.1117/1.jmm.21.4.041601
Autor:
Thibaut Bourguignon, Bertrand Le-Gratiet, Jonathan Pradelles, Sébastien Bérard-Bergerie, Guido Rademaker, Nicolas Possémé
Publikováno v:
37th European Mask and Lithography Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de312581d77b5cd7caf0824af4cb781f
https://doi.org/10.1117/12.2640140
https://doi.org/10.1117/12.2640140
Autor:
Elvire Soltani, Bertrand Le-Gratiet, Sébastien Bérard-Bergery, Jonathan Pradelles, Simon Desmoulins, Emmanuel Sicurani, Raluca Tiron
Publikováno v:
37th European Mask and Lithography Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::615e1b49513bbd58a942386c7012aff9
https://doi.org/10.1117/12.2640712
https://doi.org/10.1117/12.2640712
Autor:
Bertrand Le Gratiet, Delphine Le Cunff, Laurent Bidault, Thomas Alcaire, Sébastien Desmaison, Régis Bouyssou
Publikováno v:
Journal of Micro/Nanopatterning, Materials, and Metrology. 21
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6cd09309154bf6c6ce121c30d9b19bfc
https://doi.org/10.1117/1.jmm.21.4.041603
https://doi.org/10.1117/1.jmm.21.4.041603
Autor:
Bertrand Le-Gratiet, Régis Bouyssou, Julien Ducoté, Florent Dettoni, Thibaut Bourguignon, Vincent Morin, Romain Bange, Nivea G. Schuch, Julien Nicoulaud, Guillaume Renault, Frederic Robert, Thiago Figueiro
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e771354a876eb3a8ff8efccf91f65df
https://doi.org/10.1117/12.2615199
https://doi.org/10.1117/12.2615199
Autor:
Elvire Soltani, Bertrand Le-Gratiet, Sébastien Bérard-Bergery, Jonathan Pradelles, Romain Bange, Nivea G. Schuch, Thiago Figueiro, Raluca Tiron
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::773977953bbbf6cb4cba1dc48a893ac3
https://doi.org/10.1117/12.2613322
https://doi.org/10.1117/12.2613322
Autor:
Thibaut Bourguignon, Regis Bouyssou, Jonathan Pradelles, Sébastien Bérard-Bergery, Bertrand Le-Gratiet, Romain Bange, Nivea G. Schuch, Thiago Figueiro, Nicolas Possémé
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0588a3a055310cb941841a5d7dca41a7
https://doi.org/10.1117/12.2613327
https://doi.org/10.1117/12.2613327
Publikováno v:
Advances in Patterning Materials and Processes XXXIX.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::acaa772467db1c1d0992e19f9c41d994
https://doi.org/10.1117/12.2614005
https://doi.org/10.1117/12.2614005
Autor:
Leon van Dijk, Kedir M. Adal, Sepideh Golmakaniyoon, Bertrand Le-Gratiet, Niyam Haque, Reza Sahraeian, Auguste Lam, Richard van Haren
Publikováno v:
2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b20fe7ea6759455d9bec7257ef789b7
https://doi.org/10.1109/asmc54647.2022.9792531
https://doi.org/10.1109/asmc54647.2022.9792531