Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Bert Huis in 't Veld"'
Autor:
Antonio Ancona, Bert Huis in ’t Veld, Ronald Aarts, Ali Riza Konuk, Pietro Mario Lugarà, Francesco P. Mezzapesa, Teresa Sibillano, Domenico Rizzi
Publikováno v:
Sensors, Vol 12, Iss 8, Pp 11077-11090 (2012)
In this paper we describe a novel spectroscopic closed loop control system capable of stabilizing the penetration depth during laser welding processes by controlling the laser power. Our novel approach is to analyze the optical emission from the lase
Externí odkaz:
https://doaj.org/article/4b95d057f048417fae4c027a7e8d4ff9
Autor:
Bert Huis in 't Veld, Overmeyer, Ludger, (2), Schmidt, Michael, (2), Wegener, Konrad, (2), Malshe, Ajay, (1), Bartolo, Paulo, (1)
Publikováno v:
In CIRP Annals - Manufacturing Technology 2015 64(2):701-724
Autor:
Detlef Lohse, Ralph Pohl, Chao Sun, Bert Huis in 't Veld, Claas Willem Visser, Gerardus Richardus, Bernardus, Engelina Römer
Publikováno v:
Advanced materials, 27(27), 4087-4092. Wiley-Blackwell
3D printing of common metals is highly challenging because metals are generally solid at room conditions. Copper and gold pillars are manufactured with a resolution below 5 μm and a height up to 2 mm, using laser-induced forward transfer to create a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bfa7540aa2ec5b39d0638269a2343105
https://doi.org/10.1002/adma.201501058
https://doi.org/10.1002/adma.201501058
Publikováno v:
Journal of materials processing technology, 220, 276-284. Elsevier
A new approach is presented in this paper to link optical emission spectrum analysis to the quality of clad layers produced with laser metal deposition (LMD). A Nd:YAG laser (λ = 1.064 μm) was used to produce clad tracks with Metco 42C powder on AI
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b73761c3a2a582f4dae8c9d851941914
https://doi.org/10.1016/j.jmatprotec.2015.01.026
https://doi.org/10.1016/j.jmatprotec.2015.01.026
Publikováno v:
Proceedings of the 9th International Symposium on Laser Precision Microfabrication, 150-154
STARTPAGE=150;ENDPAGE=154;TITLE=Proceedings of the 9th International Symposium on Laser Precision Microfabrication
Journal of laser micro nanoengineering, 3(3), 206-210. Japan Laser Processing
STARTPAGE=150;ENDPAGE=154;TITLE=Proceedings of the 9th International Symposium on Laser Precision Microfabrication
Journal of laser micro nanoengineering, 3(3), 206-210. Japan Laser Processing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2d598a9ea093c9b51aa19d203106355b
https://doi.org/10.2961/jlmn.2008.03.0014
https://doi.org/10.2961/jlmn.2008.03.0014
Autor:
Detlef Lohse, Bert Huis in 't Veld, Chao Sun, Claas Willem Visser, Ralph Pohl, Gerardus Richardus, Bernardus, Engelina Römer
Publikováno v:
Physical review applied, 3(2):024001. American Physical Society
Laser-induced forward transfer (LIFT) is a 3D direct-write method suitable for precision printing of various materials, including pure metals. To understand the ejection mechanism and thereby improve deposition, here we present visualizations of ejec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::291aefc966d61eca51cd30dfdc1d3a25
https://doi.org/10.1103/physrevapplied.3.024001
https://doi.org/10.1103/physrevapplied.3.024001
Autor:
Dannis Michel Brouwer, Gerardus Richardus, Bernardus, Engelina Römer, Ger Folkersma, Bert Huis in 't Veld
Publikováno v:
Optical engineering, 53(12):126105. SPIE
Laser microforming is extensively used to align components with submicrometer accuracy, often after assembly. While laser-bending sheet metal is the most common laser-forming mechanism, the in-plane upsetting mechanism is preferred when a high actuat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cafa1fafd051e274852013e016389dde
https://research.utwente.nl/en/publications/3a6e8bed-8f34-4e79-9801-6e891d68331a
https://research.utwente.nl/en/publications/3a6e8bed-8f34-4e79-9801-6e891d68331a
Autor:
Francesco P. Mezzapesa, Ronald G.K.M. Aarts, Domenico Rizzi, Bert Huis in 't Veld, Pietro Mario Lugarà, Antonio Ancona, A.R. Konuk, Teresa Sibillano
Publikováno v:
High Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications, pp. 82390S, San Francisco, CA; United States, 21-26 January 2012
info:cnr-pdr/source/autori:Sibillano T., Ancona A., Rizzi D., Mezzapesa F., Konuk A.R., Aarts R., Huis In 't Veld B., Lugarà P.M./congresso_nome:High Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications/congresso_luogo:San Francisco, CA; United States/congresso_data:21-26 January 2012/anno:2012/pagina_da:82390S/pagina_a:/intervallo_pagine:82390S
Proceedings of the SPIE Conference on High Power Laser Materials Processing: Laser, Beam Delivery, Diagnostics, and Applications, Brussels, Belgium, April 16-20, 2012
High Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications: 24–26 January 2012, San Francisco, California, United States, 1-8
STARTPAGE=1;ENDPAGE=8;TITLE=High Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications
info:cnr-pdr/source/autori:Sibillano T., Ancona A., Rizzi D., Mezzapesa F., Konuk A.R., Aarts R., Huis In 't Veld B., Lugarà P.M./congresso_nome:High Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications/congresso_luogo:San Francisco, CA; United States/congresso_data:21-26 January 2012/anno:2012/pagina_da:82390S/pagina_a:/intervallo_pagine:82390S
Proceedings of the SPIE Conference on High Power Laser Materials Processing: Laser, Beam Delivery, Diagnostics, and Applications, Brussels, Belgium, April 16-20, 2012
High Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications: 24–26 January 2012, San Francisco, California, United States, 1-8
STARTPAGE=1;ENDPAGE=8;TITLE=High Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications
In-process monitoring and feedback control are fundamental actions for stable and good quality laser welding process. In particular, penetration depth is one of the most critical features to be monitored. In this research, overlap welding of stainles
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::16b841d9345cd4551e5bce43e97e4405
https://doi.org/10.1117/12.906778
https://doi.org/10.1117/12.906778
Closed loop control of laser welding using an optical spectroscopic sensor for Nd:YAG and CO2 lasers
Autor:
Bert Huis in 't Veld, Teresa Sibillano, Domenico Rizzi, A.R. Konuk, Ronald G.K.M. Aarts, Antonio Ancona
Publikováno v:
Proceedings of the ICALEO 2011, Orland, Fl, USA, October 23-27, 2011, 85-94
30th International Congress on Applications of Lasers and Electro-Optics, ICALEO 2011, pp. 85–94, Orlando, FL; United States, 23-27 October 2011
info:cnr-pdr/source/autori:Konuk A.R., Aarts R., In 't Veld B.H., Sibillano T., Rizzi D., Ancona A./congresso_nome:30th International Congress on Applications of Lasers and Electro-Optics, ICALEO 2011/congresso_luogo:Orlando, FL; United States/congresso_data:23-27 October 2011/anno:2011/pagina_da:85/pagina_a:94/intervallo_pagine:85–94
30th International Congress on Applications of Lasers and Electro-Optics, ICALEO 2011, pp. 85–94, Orlando, FL; United States, 23-27 October 2011
info:cnr-pdr/source/autori:Konuk A.R., Aarts R., In 't Veld B.H., Sibillano T., Rizzi D., Ancona A./congresso_nome:30th International Congress on Applications of Lasers and Electro-Optics, ICALEO 2011/congresso_luogo:Orlando, FL; United States/congresso_data:23-27 October 2011/anno:2011/pagina_da:85/pagina_a:94/intervallo_pagine:85–94
Recent developments in laser joining show the applicability of spectral analysis of the plasma plume emission to monitor and control the quality of weld. The analysis of the complete spectra makes it possible to measure specific emission lines which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2ba79e90b31020e10b93b5158d21eaa3
http://resolver.tudelft.nl/uuid:d9781534-1fd7-441a-b33f-661f460c5dd0
http://resolver.tudelft.nl/uuid:d9781534-1fd7-441a-b33f-661f460c5dd0
Autor:
Joop van Deelen, Bert Huis In 't Veld, Hero het Mannetje, Mirjam Theelen, Arjan Hovestad, H. Rendering, Paul Poodt, Zeger Vroon
Publikováno v:
2010 35th IEEE Photovoltaic Specialists Conference.
Transparent conductive oxides (TCOs) are widely used in optoelectronic applications and are a vital part in thin film solar cells. However, these materials have some drawback, such as brittleness and a maximum transmittance for a certain sheet resist
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::febd7bd032c4a9a80346a72d1da87e64
https://doi.org/10.1109/pvsc.2010.5614581
https://doi.org/10.1109/pvsc.2010.5614581