The 1/f Noise of InP Based 2DEG Devices and Its Dependence on Mobility.

Autor: Berntgen, Jurgen, Heime, Klaus

Publikováno v: IEEE Transactions on Electron Devices. Jan99, Vol. 46 Issue 1, p194. 10p. 6 Black and White Photographs, 1 Diagram, 2 Charts, 4 Graphs.