Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Bernd Doll"'
Autor:
Bernd Doll, Ernst Wittmann, Larry Lüer, Johannes Hepp, Claudia Buerhop-Lutz, Jens A. Hauch, Christoph J. Brabec, Ian Marius Peters
Publikováno v:
physica status solidi (RRL) – Rapid Research Letters.
Autor:
Bernd Doll, Christoph J. Brabec, Johannes Hepp, Ian Marius Peters, Claudia Buerhop-Lutz, Stefan Langner, Karen Forberich, J. Hauch
Publikováno v:
IEEE Journal of Photovoltaics. 12:81-87
Energy losses of photovoltaic (PV) plants because of soiling are a problem in all regions, including Germany. Soft soiling, caused by a uniform dust film, is shading a PV module and is reducing yield depending on the thickness of the debris layer. Ha
Autor:
Bernd Doll, Dirk Tegtmeyer, Christoph J. Brabec, Claudia Buerhop-Lutz, Mathis Hoffmann, Rene Schuler, Johannes Hepp, Florian Talkenberg, Manuel Baier, Jens Hauch, Ian Marius Peters
Publikováno v:
Organic, Hybrid, and Perovskite Photovoltaics XXII.
Cost-effective, fast, and non-destructive, on-site photovoltaic (PV) characterization methods are of interest to PV operators to determine countermeasures against defects causing power loss or against safety problems. Combining the advantages of both
Autor:
Vincent Christlein, Bernd Doll, Andreas Maier, Claudia Buerhop-Lutz, Christoph J. Brabec, Mathis Hoffmann, Ian Marius Peters, Johannes Hepp
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
The individual causes for power loss of photovoltaic modules are investigated for quite some time. Recently, it has been shown that the power loss of a module is, for example, related to the fraction of inactive areas. While these areas can be easily
Autor:
Juergen Parisi, Tobias Pickel, Christian Camus, Claudia Buerhop, Raphael Knecht, Christoph J. Brabec, E. Calderón del Rivero, Bernd Doll, J. Hauch, Johannes Hepp
Publikováno v:
Zeitschrift für Naturforschung 74(8), 645-653 (2019). doi:10.1515/zna-2019-0025
With the spread of photovoltaics (PV) and increasing diversity in PV panel technology, quantitative comparison of the modules is highly desirable for consistent on-site quality assessment. Electroluminescence imaging reveals many defects, such as mac
Autor:
Tobias Pickel, Thilo Winkler, Claudia Buerhop-Lutz, Mathis Hoffmann, Vincent Christlein, Tobias Würfl, Bernd Doll, Ian Marius Peters, Christoph J. Brabec, Andreas Maier, Luca Reeb
Publikováno v:
Progress in photovoltaics 29(8), 920-935 (2021). doi:10.1002/pip.3416
Seminar, Deutschland
Seminar, Deutschland
Automated inspection plays an important role in monitoring large‐scale photovoltaic power plants. Commonly, electroluminescense measurements are used to identify various types of defects on solar modules, but have not been used to determine the pow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb99cfa46c3da6d291e09887717b0b12
https://hdl.handle.net/2128/28310
https://hdl.handle.net/2128/28310
Autor:
Bernd Doll, Andreas Maier, Mathis Hoffmann, Thomas Köhler, Ian Marius Peters, Christoph J. Brabec, Frank Schebesch, Vincent Christlein, Florian Talkenberg
Publikováno v:
IEEE journal of photovoltaics 11(4), 1051-1058 (2021). doi:10.1109/JPHOTOV.2021.3072229
Visual inspection of solar modules is an important monitoring facility in photovoltaic power plants. Since a single measurement of fast CMOS sensors is limited in spatial resolution and often not sufficient to reliably detect small defects, we apply
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::58f6f31bff4ddece2b20d4a7164342ec
http://arxiv.org/abs/2011.05003
http://arxiv.org/abs/2011.05003
Autor:
Christoph J. Brabec, Bernd Doll, Andreas Maier, Vincent Christlein, Mathis Hoffmann, Florian Talkenberg
Publikováno v:
Computer Analysis of Images and Patterns ISBN: 9783030298906
CAIP (2)
Cham : Springer International Publishing, Lecture Notes in Computer Science 11679, 519-531 (2019). doi:10.1007/978-3-030-29891-3_46
Computer Analysis of Images and Patterns / Vento, Mario (Editor) [https://orcid.org/0000-0002-2948-741X] ; Cham : Springer International Publishing, 2019, Chapter 46 ; ISSN: 0302-9743=1611-3349 ; ISBN: 978-3-030-29890-6=978-3-030-29891-3 ; doi:10.1007/978-3-030-29891-3
CAIP (2)
Cham : Springer International Publishing, Lecture Notes in Computer Science 11679, 519-531 (2019). doi:10.1007/978-3-030-29891-3_46
Computer Analysis of Images and Patterns / Vento, Mario (Editor) [https://orcid.org/0000-0002-2948-741X] ; Cham : Springer International Publishing, 2019, Chapter 46 ; ISSN: 0302-9743=1611-3349 ; ISBN: 978-3-030-29890-6=978-3-030-29891-3 ; doi:10.1007/978-3-030-29891-3
Fast, non-destructive and on-site quality control tools, mainly high sensitive imaging techniques, are important to assess the reliability of photovoltaic plants. To minimize the risk of further damages and electrical yield losses, electroluminescenc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0adbe7478b7f89db0a2c12b7ea8d8b5e
https://doi.org/10.1007/978-3-030-29891-3_46
https://doi.org/10.1007/978-3-030-29891-3_46
Autor:
Bernd Doll, Cornelia Zetzmann, Tobias Pickel, Johannes Hepp, Oliver Schreer, Janine Teubner, J. Hauch, Christoph J. Brabec, Claudia Buerhop, Christian Camus
Publikováno v:
Optical engineering 58(08), 083105 (2019). doi:10.1117/1.OE.58.8.083105
Fast and nondestructive quality control tools are important to assess the reliability of photovoltaic plants. On-site inspection is essential to minimize the risk of further damage and electrical yield losses. The most effective way of achieving this
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cc8c70c3bc22298c049ca24b9e1d3e08
https://juser.fz-juelich.de/record/877315
https://juser.fz-juelich.de/record/877315
Autor:
Christian Camus, Tobias Pickel, Cornelia Zetzmann, Bernd Doll, Christoph J. Brabec, Janine Teubner, Jens Hauch, Oliver Schreer, Claudia Buerhop
Publikováno v:
Infrared Sensors, Devices, and Applications VIII.
Fast and non-destructive quality control tools are important to assess the reliability of photovoltaic plants. On-site inspection is essential to minimize the risk of module damage and electrical yield losses. This may only be achieved by using highl