Zobrazeno 1 - 10
of 152
pro vyhledávání: '"Bernard Gelloz"'
Autor:
Wiem Bouslama, Ramzi Nasser, Bernard Gelloz, Amira Ben Gouider Trabelsi, Fatemah Homoud Alkallas, Ji-Ming Song, Ezzeddine Srasra, Habib Elhouichet
Publikováno v:
Applied Sciences, Vol 13, Iss 14, p 8448 (2023)
Undoped and codoped (Eu/Na) ZnO nanocrystals (NCs) were successfully manufactured through an economical sol-gel method. X-ray diffraction (XRD) analysis demonstrated pure hexagonal wurtzite structure without secondary phases for all the samples. The
Externí odkaz:
https://doaj.org/article/74e3bcd3fb504fec963a2605682cb88e
Autor:
Bernard Gelloz, Firman Bagja Juangsa, Tomohiro Nozaki, Koji Asaka, Nobuyoshi Koshida, Lianhua Jin
Publikováno v:
Frontiers in Physics, Vol 7 (2019)
Most of the highly efficient luminescent silicon nanocrystals (SiNCs) reported to date consist of organically capped silicon cores. Here, we report a method of obtaining Si/SiO2 core/shell nanoparticles emitting at a peak energy of 1.5 eV with very h
Externí odkaz:
https://doaj.org/article/38fd124337ec4be8a6b994c2ed356286
Ellipsometric Microscope ―Design and Application of a Microscope for Oblique Observation of Samples―
Publikováno v:
Journal of the Japan Society for Precision Engineering. 86:533-536
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e90c5b016a46d3dcc7b7c7fe58290eac
https://doi.org/10.2493/jjspe.86.533
https://doi.org/10.2493/jjspe.86.533
Publikováno v:
Optical Review. 27:73-80
Owing to high accuracy in the whole measurement range, the compensator-rotating method is a powerful technique for transmission/reflection ellipsometric measurements. The compensator-rotating imaging ellipsometer, which is a system combing the optica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e71e1b856920831a34b891d922e57e8
https://doi.org/10.1007/s10043-019-00569-5
https://doi.org/10.1007/s10043-019-00569-5
Publikováno v:
Optical Technology and Measurement for Industrial Applications 2020.
Imaging ellipsometry (IE) possesses characteristics of both single-point measurement ellipsometry and optical microscopy. To obtain quantitative measurement, it is very important for design of the spectroscopic imaging ellipsometer to employ a correc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9891bea43de1d5c6b654c898d75fd26a
https://doi.org/10.1117/12.2574762
https://doi.org/10.1117/12.2574762
Publikováno v:
Japanese Journal of Applied Physics. 61:018004
Spectroscopic ellipsometry is a powerful tool for the characterization of thin films/surfaces. To simultaneously extract optical constant and film thickness from ellipsometric parameters ψ and Δ, dispersion models of material’s refractive index a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f998000854a3a1ecf9cce8cb700b02f5
https://doi.org/10.35848/1347-4065/ac42af
https://doi.org/10.35848/1347-4065/ac42af
Publikováno v:
Optical Review. 25:656-662
The diameter of cylindrical openings is conventionally measured with the mechanical and contact method. In this paper, we propose a contactless optical approach to measure dimensions of inner profile by a disk beam probe. The measurement is carried o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::06b71de99eaa7f5ed65f02511fcc9cf8
https://doi.org/10.1007/s10043-018-0459-7
https://doi.org/10.1007/s10043-018-0459-7
Publikováno v:
ECS Transactions. 86:71-81
Photo-assisted etching of porous silicon (PSi) in hydrofluoric acid (HF) solution has been, so far, not well controlled and characterized. In this paper, the progress of the photoetching of PSi formed from lightly-doped p-type silicon in ethanoic HF
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58e3366dc4b564fc35a69745eb408500
https://doi.org/10.1149/08601.0071ecst
https://doi.org/10.1149/08601.0071ecst
Publikováno v:
ECS Journal of Solid State Science and Technology. 7:P730-P735
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::914592e13a3310bc078a43ccb383c3ba
https://doi.org/10.1149/2.0121812jss
https://doi.org/10.1149/2.0121812jss
Publikováno v:
ECS Journal of Solid State Science and Technology. 10:116005
The surface of as-formed porous silicon (PSi) is terminated by Si-H bonds. Hydrogen-terminated PSi is generally unstable due to the high reactivity of these Si-H bonds. Thermally activated hydrosilylation of organic groups on hydride-terminated PSi e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d8159c4cea2d18aa3b98faf087f9510e
https://doi.org/10.1149/2162-8777/ac344b
https://doi.org/10.1149/2162-8777/ac344b