Zobrazeno 1 - 10
of 48
pro vyhledávání: '"Bernard G. Rax"'
Autor:
Arthur F. Witulski, Gabor Karsai, Robert A. Reed, Tim Holman, En Xia Zhang, Kan Li, Jeffrey S. Kauppila, Philippe C. Adell, Andrew C. Daniel, M. W. Rony, Bernard G. Rax, Mahmud Reaz, Ronald D. Schrimpf
Publikováno v:
IEEE Transactions on Nuclear Science. 68:1465-1472
Analog-to-digital converters (ADCs) with different topologies respond differently to total ionizing dose (TID). A flexible behavioral modeling approach is proposed for system-level simulation of TID effects in successive-approximation-register (SAR)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf647244db1851fc45d966ee8145583b
https://doi.org/10.1109/tns.2021.3077944
https://doi.org/10.1109/tns.2021.3077944
Autor:
Insoo Jun, Wousik Kim, D. O. Thorbourn, Aaron J. Kenna, Bernard G. Rax, Philippe R. Adell, Steve McClure, Leif Scheick
Publikováno v:
IEEE Transactions on Nuclear Science. 66:163-169
A total dose testing methodology for qualifying bipolar analog circuits for the Europa Clipper (EC) mission is presented. The method leverages the unique mission dose rate profile to bound device performance and reduces qualification test time from 1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b14f3f4a25c1cb004c82a3072db1482
https://doi.org/10.1109/tns.2018.2886723
https://doi.org/10.1109/tns.2018.2886723
Autor:
Patrick Gevargiz, Leif Scheick, Aaron J. Kenna, Jason L. Thomas, Amanda N. Bozovich, S.S. McClure, Stephanie A. Zajac, Duc N. Nguyen, Joe Davila, Bernard G. Rax, Mitch J. Sundgaard, Kelly W. Stanford
Publikováno v:
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).
We present the results of total ionizing dose testing and analysis on Electric, Electronic, and Electromechanical (EEE) parts, tested by the Jet Propulsion Laboratory in support of the Europa Clipper Mission.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8aba8a89d15ac9ad2a396876fe6c7da
https://doi.org/10.1109/redw51883.2020.9325858
https://doi.org/10.1109/redw51883.2020.9325858
Publikováno v:
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).
This paper investigates flight circuit application bias and irradiation dose rate dependencies ("test as you fly" conditions) in the total ionizing dose (TID) response of various electronic components considered for use in a space radiation environme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::178649e3495caa5bb70fb86a50590fb6
https://doi.org/10.1109/redw51883.2020.9325830
https://doi.org/10.1109/redw51883.2020.9325830
Publikováno v:
IEEE Transactions on Nuclear Science. 65:1553-1560
This paper reports proton damage in light-emitting diode (LED) and phototransistor of the Micropac 66296 optocoupler. Our results show that the optocoupler current transfer ratio (CTR) data are influenced by the gain of the phototransistor. Analysis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c7afb2ab800e47e41816daf93ee1f57
https://doi.org/10.1109/tns.2018.2819960
https://doi.org/10.1109/tns.2018.2819960
Publikováno v:
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
This paper reports proton damage in the Micropac 66183–300 optocoupler and investigates the radiation degradation of the optocoupler current transfer ratio (CTR) and transistor gain, HFE. We present statistical analysis using a one-sided tolerance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::66e6e6a510deb7aae5be9eabc835a882
https://doi.org/10.1109/radecs45761.2018.9328715
https://doi.org/10.1109/radecs45761.2018.9328715
Autor:
Amanda N. Bozovich, Bernard G. Rax, Joe Davila, Duc Nguyen, Aaron J. Kenna, Stephanie A. Zajac, Steven S. McClure, Jason L. Thomas, Leif Z. Scheick, Kelly W. Stanford, Patrick Gevargiz, Mitch J. Sundgaard
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::df1d4f6b5b647cb00290cf84111b56b0
https://doi.org/10.1109/nsrec.2018.8584267
https://doi.org/10.1109/nsrec.2018.8584267
Publikováno v:
IEEE Transactions on Nuclear Science. 62:2476-2481
Soaked-hydrogen irradiations show the H 2 limits for the total-dose and dose-rate response of bipolar technologies. We use an analytical model to extrapolate experimental observations and generate an H 2 limits/dose-rate safe-operating-area for vario
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ee910ba20df15775ce6aa1df819a60a
https://doi.org/10.1109/tns.2015.2500198
https://doi.org/10.1109/tns.2015.2500198
Publikováno v:
IEEE Transactions on Nuclear Science. 61:2818-2825
New experimental results for the yield of electron-hole pairs in SiO2 at low temperature are inconsistent with the Onsager theory of recombination. A revised model is developed to account for this, taking boundary conditions into effect. The model pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::683a95dd63e23f32a7d5b99ab6da210c
https://doi.org/10.1109/tns.2014.2367512
https://doi.org/10.1109/tns.2014.2367512
Publikováno v:
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
This paper reports proton damage in LED and phototransistor of the Micropac 66179 optocoupler. Analysis of the test data reveals interesting information, such as the dependence of the transistor gain on irradiation and photocurrent.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82d296587d813f2b7b97394de3b9f3e5
https://doi.org/10.1109/radecs.2016.8093208
https://doi.org/10.1109/radecs.2016.8093208