Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Berkin Uluutku"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 12, Iss 1, Pp 1063-1077 (2021)
Viscoelastic characterization of materials at the micro- and the nanoscale is commonly performed with the aid of force–distance relationships acquired using atomic force microscopy (AFM). The general strategy for existing methods is to fit the obse
Externí odkaz:
https://doaj.org/article/d1e8edf66a2d43dcb873dfc348e337d2
Autor:
Berkin Uluutku, Santiago D. Solares
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 453-465 (2020)
Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (stati
Externí odkaz:
https://doaj.org/article/f340ebd2188d4d7ebd4d9c7dfa9e9ea5
Autor:
Li Lin, Marshall R. McCraw, Berkin Uluutku, Yi Liu, Dayun Yan, Vikas Soni, Alex Horkowitz, Xiaoliang Yao, Ruby Limanowski, Santiago D. Solares, Isak I. Beilis, Michael Keidar
Publikováno v:
Langmuir. 39:3320-3331
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1024a6060daf01daa08ea252fc16a7b
https://doi.org/10.1021/acs.langmuir.2c03181
https://doi.org/10.1021/acs.langmuir.2c03181
Autor:
Marshall R. McCraw, Berkin Uluutku, Halen D. Solomon, Megan S. Anderson, Kausik Sarkar, Santiago D. Solares
Publikováno v:
Soft Matter. 19:451-467
We demonstrate that the method of characterizing viscoelastic materials with Atomic Force Microscopy (AFM) by fitting analytical models to force-distance (FD) curves often yields conflicting and physically unrealistic results. Because this method inv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::21561015aa63f89833470cf010e4a2ea
https://doi.org/10.1039/d2sm01331b
https://doi.org/10.1039/d2sm01331b
Autor:
Can Suer, Abid Shahriar Rahman Saadi, Rishi Maiti, Volker J. Sorger, Chandraman Patil, Rubab Amin, Veli Ongun Ozcelik, Santiago D. Solares, Berkin Uluutku
Publikováno v:
ACS Applied Electronic Materials. 3:3781-3788
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3c4a09ea63bf5b6d904440fe34ceefd
https://doi.org/10.1021/acsaelm.1c00281
https://doi.org/10.1021/acsaelm.1c00281
Publikováno v:
Reports in Mechanical Engineering. 2:156-179
Recently, much research has been performed involving the mechanical analysis of biological and polymeric samples with the use of Atomic Force Microscopy (AFM). Such materials require careful treatments which consider the rate-dependence of their visc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f540f9c3490a975b6fe11cc68a8fee27
https://doi.org/10.31181/rme200102156m
https://doi.org/10.31181/rme200102156m
Autor:
Ritesh Agarwal, Rishi Maiti, Rubab Amin, A. F. Briggs, Berkin Uluutku, Tony Low, M. A. S. R. Saadi, Mario Miscuglio, D. Van Thourhout, Chandraman Patil, J. G. Azadani, Ti Xie, Volker J. Sorger, Seth R. Bank, Santiago D. Solares
Publikováno v:
Nature Photonics. 14:578-584
In integrated photonics, specific wavelengths such as 1,550 nm are preferred due to low-loss transmission and the availability of optical gain in this spectral region. For chip-based photodetectors, two-dimensional materials bear scientifically and t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4bf9cad684ae1e31271bbf175e1b7c6
https://doi.org/10.1038/s41566-020-0647-4
https://doi.org/10.1038/s41566-020-0647-4
Force–distance curve experiments are commonly performed in atomic force microscopy (AFM) to obtain the viscoelastic characteristics of materials, such as the storage and loss moduli or compliances. The classic methods used to obtain these character
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06ded2d70544c1aac5d974360a4f2e3d
Autor:
Berkin Uluutku, Santiago D. Solares
Publikováno v:
Volume 11: 15th International Conference on Micro- and Nanosystems (MNS).
Quantitative measurement of the probe-sample interaction forces as a function of distance and time during imaging has been at the forefront of atomic force microscopy (AFM) research. This type of information is extremely valuable for understanding th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::98e86ae585ae425960da2110b3c73efc
https://doi.org/10.1115/detc2021-67205
https://doi.org/10.1115/detc2021-67205
Publikováno v:
Surface Topography: Metrology and Properties. 8:045004
Probe-induced soft sample damage in atomic force microscopy (AFM), as well as the resulting alteration of local mechanical and electrical properties of the material are explored, specifically comparing contact-mode and intermittent-contact-mode imagi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f950bcee6f15d9578e02f1c02036abb
https://doi.org/10.1088/2051-672x/abb888
https://doi.org/10.1088/2051-672x/abb888