Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Berke Erbas"'
Autor:
Xia Liu, Berke Erbas, Ana Conde-Rubio, Norma Rivano, Zhenyu Wang, Jin Jiang, Siiri Bienz, Naresh Kumar, Thibault Sohier, Marcos Penedo, Mitali Banerjee, Georg Fantner, Renato Zenobi, Nicola Marzari, Andras Kis, Giovanni Boero, Juergen Brugger
Publikováno v:
Nature Communications, Vol 15, Iss 1, Pp 1-12 (2024)
Abstract Field-effect transistors (FETs) based on two-dimensional materials (2DMs) with atomically thin channels have emerged as a promising platform for beyond-silicon electronics. However, low carrier mobility in 2DM transistors driven by phonon sc
Externí odkaz:
https://doaj.org/article/d0538fa956674580a03fbb5b477b264f
Combining thermal scanning probe lithography and dry etching for grayscale nanopattern amplification
Autor:
Berke Erbas, Ana Conde-Rubio, Xia Liu, Joffrey Pernollet, Zhenyu Wang, Arnaud Bertsch, Marcos Penedo, Georg Fantner, Mitali Banerjee, Andras Kis, Giovanni Boero, Juergen Brugger
Publikováno v:
Microsystems & Nanoengineering, Vol 10, Iss 1, Pp 1-10 (2024)
Abstract Grayscale structured surfaces with nanometer-scale features are used in a growing number of applications in optics and fluidics. Thermal scanning probe lithography achieves a lateral resolution below 10 nm and a vertical resolution below 1 n
Externí odkaz:
https://doaj.org/article/570f9bacaea244b1b0cc956542fe903c
Publikováno v:
Archive of Applied Mechanics. 93:355-367
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a32e80b51051f97a192e1662c6ae6713
https://doi.org/10.1007/s00419-022-02151-z
https://doi.org/10.1007/s00419-022-02151-z