Unveiling the impact of embedding resins on the physicochemical traits of wood cell walls with subcellular functional probing

Autor: Coste, Raphaël, Soliman, Mikhael, Bercu, Nicolas B., Potiron, Sylvain, Lasri, Karima, Aguié-Béghin, Véronique, Tetard, Laurene, Chabbert, Brigitte, Molinari, Michaël

Publikováno v: In Composites Science and Technology 5 January 2021 201

Coupled Non-Destructive Methods, Kelvin Force Probe Microscopy and µ-Raman to Characterize Doping in 4H-SiC Power Devices

Autor: Vuillermet, Enora, Wu, Kuan Ting, Sedilot, Anael, Deturche, Regis, Bercu, Nicolas, Usureau, Elise, Beal, Jérémie, Lazar, Mihai

Publikováno v: Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 358 Issue: 1 p13-21, 9p

KPFM - Raman Spectroscopy Coupled Technique for the Characterization of Wide Bandgap Semiconductor Devices

Autor: Bercu, Nicolas, Lazar, Mihai, Simonetti, Olivier, Adam, Pierre-Michel, Brouillard, Mélanie, Giraudet, Louis

Publikováno v: Materials Science Forum
Materials Science Forum, 2022, 1062, pp.330-334. ⟨10.4028/p-c35702⟩
13th European Conference on Silicon Carbide and Related Materials( ECSCRM2020-2021 )
13th European Conference on Silicon Carbide and Related Materials( ECSCRM2020-2021 ), Oct 2021, Tours, France

International audience; A non-destructive technique for the characterization of the doped regions inside wide bandgap (WBG) semiconductor structures of power devices is presented. It consists in local measurements of the surface potential by Kelvin P

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::46c843cac50cd414d7cf6faaa0a81437
https://doi.org/10.4028/p-c35702

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