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pro vyhledávání: '"Ber-Chin Yap"'
Autor:
Ber-Chin Yap, C. Newberg
Publikováno v:
2004 Electrical Overstress/Electrostatic Discharge Symposium.
DC resistance testing using standard commercial electrodes has been a simple, standard way adopted by many for their evaluation of dissipative materials. However, we have observed that this test is ineffective for the detection of ldquohot spotsrdquo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6186e4534baa04cd160bc83c26e905a4
https://doi.org/10.1109/eosesd.2004.5272607
https://doi.org/10.1109/eosesd.2004.5272607
Autor:
Ber-Chin Yap, C.R. Patton
Publikováno v:
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).
A simple loop antenna detector was used to successfully troubleshoot reference clock failures during servo-write that were caused by the EMI from distant metal-to-metal ESD events. Covering one metal surface with a dissipative material reduced the di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b32e33aefe90a2c4a26e08699749636
https://doi.org/10.1109/eosesd.2000.890051
https://doi.org/10.1109/eosesd.2000.890051
Autor:
Ber-Chin Yap, Fromm, L.
Publikováno v:
2003 Electrical Overstress/Electrostatic Discharge Symposium; 2003, p1-9, 9p
Autor:
Ber-Chin Yap, Turangan, J.
Publikováno v:
2001 Electrical Overstress/Electrostatic Discharge Symposium; 2001, p159-165, 7p
Investigation of ESD transient EMI causing spurious clock track read transitions during servo-write.
Autor:
Ber-Chin Yap, Patton, C.R.
Publikováno v:
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476); 2000, p233-238, 6p
Publikováno v:
Japanese Journal of Applied Physics. 21:L523
Longitudinal hypersonic velocities in PMMA under uniaxial tensile stress at room temperature were studied. It was observed that the velocity of local thermal phonons along the stress direction showed a gradual softening with the applied stress, and t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::111a85d16000bb53a3926a9a86727269
https://doi.org/10.1143/jjap.21.l523
https://doi.org/10.1143/jjap.21.l523
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