Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Benthem, K van"'
Autor:
Pennycook, S. J., Chisholm, M. F., Lupini, A. R., Varela, M., Borisevich, A. Y., Pantelides, T., Benthem, K. Van, Shibata, N., Molina, S. I., Rashkeev, S. N.
The successful correction of lens aberrations in scanning transmission electron microscopy has allowed an improvement in resolution by a factor of two in just a few years. The benefits for materials research are far greater than a factor of two might
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3106::262853216dcc91f6f186a1dca974ca99
https://hdl.handle.net/11421/1649
https://hdl.handle.net/11421/1649
The electronic structure of the Pd/SrTiO3 interface, which serves as a model system for more complex metal/ceramic interfaces, is studies in terms of local site - and momentum-projected densities of states. Band structures were calculated using densi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::7bac797da79fa5b4efe41a6deeea9c23
https://publica.fraunhofer.de/handle/publica/207619
https://publica.fraunhofer.de/handle/publica/207619
Autor:
Varela, M., Lupini, A.R., Benthem, K. van, Borisevich, A.Y., Chisholm, M.F., Shibata, N., Abe, E., Pennycook, S.J.
Publikováno v:
Annual Review of Materials Research; August 2005, Vol. 35 Issue: 1 p539-569, 31p
Publikováno v:
Ultramicroscopy; 2001, Vol. 86 Issue: 3 p303-318, 16p
Publikováno v:
Microscopy & Microanalysis; Jul2009 Supplement 2, Vol. 15 Issue S2, p1426-1427, 2p
Publikováno v:
Microscopy & Microanalysis; Jul2009 Supplement 2, Vol. 15 Issue S2, p1178-1179, 2p
Autor:
Pennycook, S, Chisholm, M, Lupini, A, Peng, Y, Varela, M, Benthem, K van, Borisevich, A, Jonge, N de, Oxley, M
Publikováno v:
Microscopy & Microanalysis; Aug2006 Supplement, Vol. 12 Issue S02, p132-133, 2p
Publikováno v:
Microscopy & Microanalysis; Aug2006 Supplement, Vol. 12 Issue S02, p1574-1575, 2p
Publikováno v:
Microscopy & Microanalysis; Aug2006 Supplement, Vol. 12 Issue S02, p1562-1563, 2p