Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Benoit Mongellaz"'
Publikováno v:
Microelectronics Reliability. 43:1513-1518
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f44566e5f9d439c81add9d824b7ee5b6
https://doi.org/10.1016/s0026-2714(03)00268-3
https://doi.org/10.1016/s0026-2714(03)00268-3
Publikováno v:
Microelectronics Reliability. 42:1353-1358
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0e3fdcea7dd4aa076ff079aaa998aecf
https://doi.org/10.1016/s0026-2714(02)00148-8
https://doi.org/10.1016/s0026-2714(02)00148-8
Publikováno v:
Languages for System Specification ISBN: 1402079907
Because of the evolution of the reliability of electronic circuits toward very low failure rate, the statistical analyses through accelerated ageing experiments become too expensive. Today, a deterministic approach of the physics of failure is necess
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8411baa362685d1b8028f81f8a7d9985
https://hal.archives-ouvertes.fr/hal-00181922
https://hal.archives-ouvertes.fr/hal-00181922
