Zobrazeno 1 - 10
of 34
pro vyhledávání: '"Benjamin W. Caplins"'
Autor:
Benjamin W. Caplins, Callie I. Higgins, Thomas J. Kolibaba, Uwe Arp, C. Cameron Miller, Dianne L. Poster, Clarence J. Zarobila, Yuqin Zong, Jason P. Killgore
Publikováno v:
Addit Manuf
Vat photopolymerization (VP) is a rapidly growing category of additive manufacturing. As VP methods mature the expectation is that the quality of printed parts will be highly reproducible. At present, detailed characterization of the light engines us
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3f514ec8736d422c5d0161cdfbfb92bc
https://europepmc.org/articles/PMC9890382/
https://europepmc.org/articles/PMC9890382/
Publikováno v:
Microscopy and Microanalysis. 27:412-415
Autor:
Matthew D. Brubaker, David R. Diercks, Norman A. Sanford, Brian P. Gorman, Kris A. Bertness, Ashwin K. Rishinaramangalam, Albert V. Davydov, Benjamin W. Caplins, Ann N. Chiaramonti, Luis Miaja-Avila, Daniel F. Feezell, Paul T. Blanchard
Publikováno v:
The Journal of Physical Chemistry C. 125:2626-2635
Laser-pulsed atom probe tomography (LAPT) is a materials characterization technique that has been widely applied in the study and characterization of III-nitride semiconductors. To date, most of th...
Autor:
Anthony P. Kotula, Jason P. Killgore, Edward J. Garboczi, Callie I. Higgins, Tobin E. Brown, Veruska Malavé, Benjamin W. Caplins
Publikováno v:
ACS Applied Polymer Materials. 3:290-298
In high-resolution stereolithography, printed parts deviate significantly from the projected photomask because of the reaction complexity on the voxel scale. To better understand the reaction proce...
Publikováno v:
Carbon. 149:400-406
A scanning transmission electron diffraction method is developed for use in the scanning electron microscope to perform orientational characterization of 2D materials. The method can generate orientation maps of monolayer graphene over a field of vie
Autor:
David R. Diercks, Benjamin W. Caplins, Norman A. Sanford, Ann N. Chiaramonti, Luis Miaja-Avila, Paul T. Blanchard
Publikováno v:
Ultramicroscopy
Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here, we describe a post-processing technique developed to increase the quality of mass spectra of strongly insul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b830ba85d06a3e15d4f57558d2c9e37d
https://europepmc.org/articles/PMC7536741/
https://europepmc.org/articles/PMC7536741/
Autor:
Norman A. Sanford, Benjamin W. Caplins, David R. Diercks, Brian P. Gorman, Paul T. Blanchard, Ann N. Chiaramonti, Luis Miaja-Avila
Publikováno v:
Microsc Microanal
This paper describes initial experimental results from an extreme ultraviolet (EUV) radiation-pulsed atom probe microscope. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon energy), obtained through high harmonic gener
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dfa5953e33b2be249a03c7db6c330b95
https://europepmc.org/articles/PMC7195254/
https://europepmc.org/articles/PMC7195254/
Autor:
Luis Miaja-Avila, Norman A. Sanford, Ann N. Chiaramonti, Benjamin W. Caplins, Brian P. Gorman, David R. Diercks
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXXIV.
We present a different approach to laser-assisted atom probe tomography, where instead of using a near-UV laser for inducing a thermal transient, we use an extreme-ultraviolet coherent light source to trigger field ion emission at the tip's apex. The
Autor:
Jason D. Holm, Benjamin W. Caplins
Scanning electron microscopes (SEMs) are an essential tool for analyzing microelectronic failures. They reveal features over multiple length scales and can be used, with appropriate detectors, to examine grain size and orientation, compositional dist
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ffb1f237a69caa168aad9aeca370650
https://doi.org/10.31399/asm.tb.stemsem.9781627082921
https://doi.org/10.31399/asm.tb.stemsem.9781627082921
Autor:
Paul T. Blanchard, David R. Diercks, Luis Miaja-Avila, Ann N. Chiaramonti, Norman A. Sanford, Benjamin W. Caplins
Publikováno v:
Microscopy and Microanalysis. 26:2880-2881