Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Benjamin ALLAERT"'
Autor:
Mohammed Mallik, Benjamin Allaert, Esteban Egea-Lopez, Davy P. Gaillot, Joe Wiart, Laurent Clavier
Publikováno v:
IEEE Access, Vol 12, Pp 49476-49488 (2024)
Electromagnetic field exposure (EMF) has grown to be a critical concern as a consequence of the ongoing installation of fifth-generation cellular networks (5G). The lack of measurements makes it difficult to accurately assess the EMF in a specific ur
Externí odkaz:
https://doaj.org/article/c008967fc8634dbc8ac19f7ab33fe8de
Autor:
Mohammed Mallik, Angesom Ataklity Tesfay, Benjamin Allaert, Redha Kassi, Esteban Egea-Lopez, Jose-Maria Molina-Garcia-Pardo, Joe Wiart, Davy P. Gaillot, Laurent Clavier
Publikováno v:
Sensors, Vol 22, Iss 24, p 9643 (2022)
With the ongoing fifth-generation cellular network (5G) deployment, electromagnetic field exposure has become a critical concern. However, measurements are scarce, and accurate electromagnetic field reconstruction in a geographic region remains chall
Externí odkaz:
https://doaj.org/article/ff312e6fccfe46f39771e8eea3c2349c
Publikováno v:
Face Analysis Under Uncontrolled Conditions. :223-242
Publikováno v:
Face Analysis Under Uncontrolled Conditions. :147-155
Publikováno v:
Face Analysis Under Uncontrolled Conditions. :157-190
Publikováno v:
Face Analysis Under Uncontrolled Conditions. :243-269
Publikováno v:
Face Analysis Under Uncontrolled Conditions. :271-285
Publikováno v:
Face Analysis Under Uncontrolled Conditions. :191-222
Publikováno v:
Face Analysis Under Uncontrolled Conditions. :287-291