Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Benedikt Hauer"'
Autor:
Benedikt Hauer, Dominic Buchta
Infrarotmesstechnik bietet eine Möglichkeit, ultradünne Beschichtungen deutlich unter 100 nm Dicke schnell, genau und zerstörungsfrei nachzuweisen und zu vermessen. Im Gegensatz zu anderen Methoden ist dies auch auf dreidimensional geformten Oberf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e5167586e35d4a841b4bfc1a08906cf8
https://publica.fraunhofer.de/handle/publica/430586
https://publica.fraunhofer.de/handle/publica/430586
Autor:
Nabil Bassim, Thomas Taubner, Jennifer K. Hite, Benedikt Hauer, Claire E. Marvinney, Joshua D. Caldwell, Martin Lewin, Alexander J. Giles, Robert E. Stahlbusch, N. A. Mahadik
Publikováno v:
Enhanced Spectroscopies and Nanoimaging 2020.
We show how extended defects in wide bandgap semiconductors manifest in the nanoscale infrared phonon response probed by scattering-type scanning near-field optical microscopy (s-SNOM). We correlate the s-SNOM response of various defects in 4H-SiC wi
Autor:
Matthias Wuttig, Martin Lewin, Thomas Taubner, Ulrich Simon, Benedikt Hauer, Matti R. Wirtssohn, Peter Jost, Antonio M. Mio, Marvin Kaminski, Tobias Saltzmann, Lars Mester, Seung-Jae Chong, Marc Pohlmann
Publikováno v:
ACS Applied Nano Materials. 1:6834-6842
Sb2Te3 exhibits a plethora of fundamentally relevant electronic phenomena enabling electronic phase change memory cells, thermoelectric devices, and three-dimensional topological insulator structur...
Publikováno v:
Nano Letters. 15:2787-2793
We report nanoscale-resolved optical investigations on the local material properties of Sb2Te3 hexagonal platelets grown by solvothermal synthesis. Using mid-infrared near-field microscopy, we find a highly symmetric pattern, which is correlated to a
Autor:
Thomas Taubner, Nadeemullah A. Mahadik, Robert E. Stahlbush, Nabil Bassim, Martin Lewin, Alexander J. Giles, Joshua D. Caldwell, Benedikt Hauer, Claire E. Marvinney, Jennifer K. Hite
Publikováno v:
Advanced Functional Materials. 30:1907357
Publikováno v:
Optics express 24(5), 4431-4441 (2016). doi:10.1364/OE.24.004431
Optics express 24(5), 4431-4441 (2016). doi:10.1364/OE.24.004431
Published by Optical Society of America, Washington, DC
Published by Optical Society of America, Washington, DC
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::079473958177d10f87861ff0f4a04706
Autor:
Robert Bittl, Benedikt Hauer, Oleksandr Astakhov, Markus Trautwein, Martin Stutzmann, Sonja Matich, Hans Huebl, K. Klein, Martin S. Brandt, Friedhelm Finger, Benedikt Stoib
Publikováno v:
Review of scientific instruments 84(10), 103911-(2013). doi:10.1063/1.4827036
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band microwave reson
Publikováno v:
Nano letters. 13(11)
Plasmonic antennas are crucial components for nano-optics and have been extensively used to enhance sensing, spectroscopy, light emission, photodetection, and others. Recently, there is a trend to search for new plasmonic materials with low intrinsic
Autor:
Benedikt Hauer, Benedikt Stoib, Friedhelm Finger, Hans Huebl, Konrad Klein, Markus Trautwein, Brandt, Martin S., Martin Stutzmann, Oleksandr Astakhov, Robert Bittl, Sonja Matich
Publikováno v:
Web of Science
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band microwave reson
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a4075188d831ce9ec64c59fa9010e498
Publikováno v:
Ultramicroscopy. 126
We present a systematic study of the effect of the tip vibration amplitude in scattering-type scanning near-field optical microscopy (s-SNOM) on the visibility of buried structures in terms of image contrast, signal strength, and noise. When varying