Zobrazeno 1 - 10
of 60
pro vyhledávání: '"Ben-Je Lwo"'
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Publikováno v:
2021 16th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 9:921-926
The parasitic effect inside through-silicon via (TSV) packaging under radio frequency (RF) operation may cause abnormal signals in circuit performance. On the bases of a self-developed deembedding technique, we investigated the high-frequency charact
Autor:
Yao-Shing Chen, Ben-Je Lwo
Publikováno v:
2020 15th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
Flexible thermoelectric (TE) products that convert temperature difference into electrical energy can be used as textile materials to harvest human body heat into electrical power for portable, low-power microelectronic products. To this end, this stu
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 7:27-32
The contact resistance of microbumps in a plastic ball grid array packaging with a through-silicon-via (TSV) structure was characterized. Accordingly, a self-designed TSV daisy-chain circuit was proposed to facilitate the formulation of the measureme
Publikováno v:
2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
Thermal warpage creates during fan-out panel level package (FOPLP) manufacturing process and it may causes challenges on subsequent procedures. To this end, finite element analysis (FEA) with element birth and death techniques were performed in this
Autor:
Ben-Je Lwo, Frank M.-S. Lin
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 6:185-191
Through silicon via (TSV) is the key technology used in 2.5-D and 3-D packaging. Evaluating the reliability of products using this new technology has been challenging because of complex environmental factors. The aim of this paper was to design and i
Autor:
Ben-Je Lwo, Yao-Shing Chen
Publikováno v:
2017 12th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
Based on our previous works, this paper proposes a new measurement methodology to extract the Seebeck coefficients for single layer, thin-film thermoelectric devices developed on different flexible substrates. With the new sandwich-like apparatus des
Autor:
Ben-Je Lwo, Yao-Shing Chen
Publikováno v:
Coatings
Volume 9
Issue 12
Volume 9
Issue 12
This paper presents the realization of a flexible thermoelectric (TE) generator as a textile fabric that converts human body heat into electrical energy for portable, low-power microelectronic products. In this study, an organic non-toxic conductive
Publikováno v:
International Journal of Electronics. 100:1256-1269
Through-silicon via (TSV) is one of the key technologies on three-dimensional integration packaging. In this article, an experimental methodology with circuit models was proposed for electrical characteristic tests on typical TSV structures. To this