Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Ben Stahl"'
Autor:
Cathy Gow, Edward Crawford, Yongchun Xin, Kan Zhang, Jang Sim, Fan Zheng, Dave Salvador, Rebekah Sheraw, Ben Stahl, Bryan Rhoads, Ishtiaq Ahsan, Brett Engel, Amanda L. Tessier, Xiao Pan, Brad Austin, Lori Kermel, William Davies
Publikováno v:
2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
In the state of the art development of chip manufacturing (FinFet technology for example) both optical inspection and inline electrical test are deployed to monitor and facilitate the process development. While optical inspection provides critical pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b735df40ec4c5974d6c4b406d8f530a
https://doi.org/10.1109/asmc.2016.7491094
https://doi.org/10.1109/asmc.2016.7491094
Autor:
Ben Stahl
Publikováno v:
Equity & Excellence in Education. 3:30-34
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17c6ed6830f60917b3c89cf6404a2d80
https://doi.org/10.1080/0020486650030404
https://doi.org/10.1080/0020486650030404