Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Bellas DV"'
Autor:
Fotiadis K; Department of Informatics, Aristotle University of Thessaloniki, 54124 Thessaloniki, Greece.; Center for Interdisciplinary Research and Innovation (CIRI-AUTH), Balkan Center, Buildings A & B, 10th km Thessaloniki-Thermi Rd, 57001 Thessaloniki, Greece., Chatzianagnostou E; Department of Informatics, Aristotle University of Thessaloniki, 54124 Thessaloniki, Greece.; Center for Interdisciplinary Research and Innovation (CIRI-AUTH), Balkan Center, Buildings A & B, 10th km Thessaloniki-Thermi Rd, 57001 Thessaloniki, Greece., Spasopoulos D; Department of Informatics, Aristotle University of Thessaloniki, 54124 Thessaloniki, Greece.; Center for Interdisciplinary Research and Innovation (CIRI-AUTH), Balkan Center, Buildings A & B, 10th km Thessaloniki-Thermi Rd, 57001 Thessaloniki, Greece., Simos S; Department of Informatics, Aristotle University of Thessaloniki, 54124 Thessaloniki, Greece.; Center for Interdisciplinary Research and Innovation (CIRI-AUTH), Balkan Center, Buildings A & B, 10th km Thessaloniki-Thermi Rd, 57001 Thessaloniki, Greece., Bellas DV; Department of Informatics, Aristotle University of Thessaloniki, 54124 Thessaloniki, Greece.; Center for Interdisciplinary Research and Innovation (CIRI-AUTH), Balkan Center, Buildings A & B, 10th km Thessaloniki-Thermi Rd, 57001 Thessaloniki, Greece.; Department of Materials Science and Engineering, University of Ioannina, 45110 Ioannina, Greece., Bhalerao O; AMO GmbH, Advanced Microelectronic Center Aachen, 52074 Aachen, Germany.; Electronic Devices, RWTH Aachen University, 52074 Aachen, Germany., Suckow S; AMO GmbH, Advanced Microelectronic Center Aachen, 52074 Aachen, Germany., Lemme MC; AMO GmbH, Advanced Microelectronic Center Aachen, 52074 Aachen, Germany.; Electronic Devices, RWTH Aachen University, 52074 Aachen, Germany., Lidorikis E; Department of Materials Science and Engineering, University of Ioannina, 45110 Ioannina, Greece., Pleros N; Department of Informatics, Aristotle University of Thessaloniki, 54124 Thessaloniki, Greece.; Center for Interdisciplinary Research and Innovation (CIRI-AUTH), Balkan Center, Buildings A & B, 10th km Thessaloniki-Thermi Rd, 57001 Thessaloniki, Greece.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2024 Jun 07; Vol. 24 (12). Date of Electronic Publication: 2024 Jun 07.
Autor:
Vangelidis I; Department of Materials Science and Engineering, University of Ioannina, Ioannina 45110, Greece., Bellas DV; Department of Materials Science and Engineering, University of Ioannina, Ioannina 45110, Greece.; Department of Informatics, Center for Interdisciplinary Research and Innovation, Aristotle University of Thessaloniki, Thessaloniki 57001, Greece., Suckow S; AMO GmbH, Advanced Microelectronic Center Aachen (AMICA), Otto-Blumenthal-Strasse 25, Aachen 52074, Germany., Dabos G; Department of Informatics, Center for Interdisciplinary Research and Innovation, Aristotle University of Thessaloniki, Thessaloniki 57001, Greece., Castilla S; ICFO - Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, Castelldefels, Barcelona 08860, Spain., Koppens FHL; ICFO - Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, Castelldefels, Barcelona 08860, Spain.; ICREA - Institució Catalana de Recerca i Estudis Avançats, Barcelona 08010, Spain., Ferrari AC; Cambridge Graphene Centre, University of Cambridge, Cambridge CB3 0FA, U.K., Pleros N; Department of Informatics, Center for Interdisciplinary Research and Innovation, Aristotle University of Thessaloniki, Thessaloniki 57001, Greece., Lidorikis E; Department of Materials Science and Engineering, University of Ioannina, Ioannina 45110, Greece.; University Research Center of Ioannina (URCI), Institute of Materials Science and Computing, Ioannina 45110, Greece.
Publikováno v:
ACS photonics [ACS Photonics] 2022 Jun 15; Vol. 9 (6), pp. 1992-2007. Date of Electronic Publication: 2022 Jun 02.
Autor:
Kalfagiannis N; Nottingham Trent University, School of Science and Technology, Nottingham, NG11 8NS, UK., Siozios A; University of Ioannina, Department of Materials Science and Engineering, 45110 Ioannina, Greece., Bellas DV; University of Ioannina, Department of Materials Science and Engineering, 45110 Ioannina, Greece., Toliopoulos D; University of Ioannina, Department of Materials Science and Engineering, 45110 Ioannina, Greece., Bowen L; University of Durham, G. J. Russell Microscopy Facility, South Road, Durham, DH1 3LE, UK., Pliatsikas N; Aristotle University of Thessaloniki, Department of Physics, 54124 Thessaloniki, Greece., Cranton WM; Nottingham Trent University, School of Science and Technology, Nottingham, NG11 8NS, UK and Sheffield Hallam University, Materials and Engineering Research Institute, Sheffield, S11 WB, UK., Kosmidis C; University of Ioannina, Department of Physics, 45110 Ioannina, Greece., Koutsogeorgis DC; Nottingham Trent University, School of Science and Technology, Nottingham, NG11 8NS, UK., Lidorikis E; University of Ioannina, Department of Materials Science and Engineering, 45110 Ioannina, Greece., Patsalas P; Aristotle University of Thessaloniki, Department of Physics, 54124 Thessaloniki, Greece.
Publikováno v:
Nanoscale [Nanoscale] 2016 Apr 21; Vol. 8 (15), pp. 8236-44.
Autor:
Siozios A; Department of Materials Science and Engineering, University of Ioannina, Ioannina, GR-45110, Greece., Kalfagiannis N, Bellas DV, Bazioti C, Dimitrakopulos GP, Vourlias G, Cranton WM, Lidorikis E, Koutsogeorgis DC, Patsalas P
Publikováno v:
Nanotechnology [Nanotechnology] 2015 Apr 17; Vol. 26 (15), pp. 155301. Date of Electronic Publication: 2015 Mar 24.