Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Beisig, Nico"'
Autor:
Grünewald, Lukas, Nerz, Daniel, Langer, Marco, Meyer, Sven, Beisig, Nico, Cayado, Pablo, Hänisch, Jens, Holzapfel, Bernhard, Gerthsen, Dagmar
Thin-film technology is used in many applications and often requires structural and chemical analyses on the nanoscale. (Scanning) transmission electron microscopy ((S)TEM) in a dedicated (S)TEM instrument is a powerful analysis tool for this purpose
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c6f44d8bc759d30ccfc7808dc572f0bb
https://publikationen.bibliothek.kit.edu/1000147936/148920613
https://publikationen.bibliothek.kit.edu/1000147936/148920613
