Life test result on 4 channel VCELs chip used in 28Gb/s data transfer in space application

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Publikováno v: In Microelectronics Reliability November 2023 150

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Publikováno v: In Microelectronics Reliability September 2018 88-90:1108-1112

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Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes

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InGaP/InGaAs/Ge microcells robustness assessment

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Publikováno v: 17th Conference on Concentrated Photovoltaics Systems (CPV17)
17th Conference on Concentrated Photovoltaics Systems (CPV17), Apr 2021, Freiburg, Germany

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::eb662392b8c3f18090d14da2a2a655b9
https://hal.archives-ouvertes.fr/hal-03349727