Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Beate Volkmann"'
Autor:
Maximilian Lederer, Thomas Kämpfe, Norman Vogel, Dirk Utess, Beate Volkmann, Tarek Ali, Ricardo Olivo, Johannes Müller, Sven Beyer, Martin Trentzsch, Konrad Seidel, Lukas M. Eng
Publikováno v:
Nanomaterials, Vol 10, Iss 2, p 384 (2020)
The microstructure of ferroelectric hafnium oxide plays a vital role for its application, e.g., non-volatile memories. In this study, transmission Kikuchi diffraction and scanning transmission electron microscopy STEM techniques are used to compare t
Externí odkaz:
https://doaj.org/article/f0ee31aa85974584bd9a5b207a0b9b1f
Publikováno v:
Practical Metallography. 40:139-149
Defined mechanical and electrical properties can be achieved by alloying of aluminum and a subsequent thermo-mechanical treatment. The transmission electron microscopy is used for the characterization of the precipitations and dispersoides which dete
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f81f1ef57484f299e8631d0330d10bbd
https://doi.org/10.1515/pm-2003-400306
https://doi.org/10.1515/pm-2003-400306
Publikováno v:
Practical Metallography. 39:117-125
Transmission electron microscopy (TEM) gains increasing importance in characterizing microelectronic components since the characteristic structures become smaller and smaller. Transmission electron microscopic investigations need specially prepared s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e3d9a1881d265016140d972d25ba7a8
https://doi.org/10.1515/pm-2002-390302
https://doi.org/10.1515/pm-2002-390302
Publikováno v:
Microscopy and Microanalysis. 10:1166-1167
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2659d664a9f2c81b1a6aeef18f706c04
https://doi.org/10.1017/s1431927604881911
https://doi.org/10.1017/s1431927604881911