Zobrazeno 1 - 10
of 556
pro vyhledávání: '"Batenburg KJ"'
Autor:
Vădineanu S; Leiden Institute of Advanced Computer Science, Leiden University, 2311 EZ Leiden, The Netherlands., Pelt DM; Leiden Institute of Advanced Computer Science, Leiden University, 2311 EZ Leiden, The Netherlands., Dzyubachyk O; The Division of Image Processing, Leiden University Medical Center, 2333 ZA Leiden, The Netherlands., Batenburg KJ; Leiden Institute of Advanced Computer Science, Leiden University, 2311 EZ Leiden, The Netherlands.
Publikováno v:
Journal of imaging [J Imaging] 2024 Jul 17; Vol. 10 (7). Date of Electronic Publication: 2024 Jul 17.
Autor:
Bossema FG; Centrum Wiskunde & Informatica, Amsterdam, The Netherlands. bossema@cwi.nl.; Rijksmuseum, Amsterdam, The Netherlands. bossema@cwi.nl., Palenstijn WJ; Centrum Wiskunde & Informatica, Amsterdam, The Netherlands.; Leiden Institute of Advanced Computer Science, Universiteit Leiden, Leiden, The Netherlands., Heginbotham A; The J. Paul Getty Museum, Los Angeles, USA., Corona M; The J. Paul Getty Museum, Los Angeles, USA., van Leeuwen T; Centrum Wiskunde & Informatica, Amsterdam, The Netherlands.; Universiteit Utrecht, Utrecht, The Netherlands., van Liere R; Centrum Wiskunde & Informatica, Amsterdam, The Netherlands.; Technische Universiteit Eindhoven, Eindhoven, The Netherlands., Dorscheid J; Rijksmuseum, Amsterdam, The Netherlands., O'Flynn D; British Museum, London, UK., Dyer J; British Museum, London, UK., Hermens E; Fitzwilliam Museum, Cambridge University, Cambridge, UK., Batenburg KJ; Centrum Wiskunde & Informatica, Amsterdam, The Netherlands.; Leiden Institute of Advanced Computer Science, Universiteit Leiden, Leiden, The Netherlands.
Publikováno v:
Nature communications [Nat Commun] 2024 May 14; Vol. 15 (1), pp. 3939. Date of Electronic Publication: 2024 May 14.
Publikováno v:
Optics express [Opt Express] 2024 Mar 11; Vol. 32 (6), pp. 9019-9041.
Autor:
Pramanik D; Evolutionary Ecology Naturalis Biodiversity Center Darwinweg 2 2333 CR Leiden The Netherlands.; Institute of Biology Leiden, Faculty of Science Leiden University Sylviusweg 72 2333 BE Leiden The Netherlands.; Research Center for Horticulture, Research Organization for Agriculture and Food National Research and Innovation Agency (Badan Riset dan Inovasi Nasional/BRIN) Cibinong Science Center, Jl. Raya Jakarta-Bogor, Pakansari, Cibinong West Java 16915 Indonesia., Vaskimo L; Faculty of Science and Technology University of Applied Sciences Leiden Zernikedreef 11 2333 CK Leiden The Netherlands., Batenburg KJ; Leiden Institute of Advanced Computer Science, Faculty of Science Leiden University, Snellius Niels Bohrweg 1 2333 CA Leiden The Netherlands.; Computational Imaging Centrum Wiskunde en Informatica Science Park 123 1090 GB Amsterdam The Netherlands., Kostenko A; Computational Imaging Centrum Wiskunde en Informatica Science Park 123 1090 GB Amsterdam The Netherlands., Droppert K; Faculty of Science and Technology University of Applied Sciences Leiden Zernikedreef 11 2333 CK Leiden The Netherlands., Smets E; Evolutionary Ecology Naturalis Biodiversity Center Darwinweg 2 2333 CR Leiden The Netherlands.; Institute of Biology Leiden, Faculty of Science Leiden University Sylviusweg 72 2333 BE Leiden The Netherlands.; Ecology, Evolution and Biodiversity Conservation, KU Leuven Kasteelpark Arenberg 31, BOX 2435 3001 Leuven Belgium., Gravendeel B; Evolutionary Ecology Naturalis Biodiversity Center Darwinweg 2 2333 CR Leiden The Netherlands.; Institute of Biology Leiden, Faculty of Science Leiden University Sylviusweg 72 2333 BE Leiden The Netherlands.; Radboud Institute for Biological and Environmental Sciences Radboud University Heyendaalseweg 135 6500 GL Nijmegen The Netherlands.
Publikováno v:
Applications in plant sciences [Appl Plant Sci] 2024 Feb 09; Vol. 12 (1), pp. e11567. Date of Electronic Publication: 2024 Feb 09 (Print Publication: 2024).
Autor:
Andriiashen V; Computational Imaging, Centrum Wiskunde en Informatica, Amsterdam, The Netherlands., van Liere R; Computational Imaging, Centrum Wiskunde en Informatica, Amsterdam, The Netherlands.; Faculteit Wiskunde en Informatica, Technical University Eindhoven, Eindhoven, The Netherlands., van Leeuwen T; Computational Imaging, Centrum Wiskunde en Informatica, Amsterdam, The Netherlands.; Mathematical Institute, Utrecht University, Utrecht, The Netherlands., Batenburg KJ; Computational Imaging, Centrum Wiskunde en Informatica, Amsterdam, The Netherlands.; Leiden Institute of Advanced Computer Science, Leiden University, Leiden, The Netherlands.
Publikováno v:
Journal of X-ray science and technology [J Xray Sci Technol] 2024; Vol. 32 (4), pp. 1099-1119.
Autor:
Graas A; Computational Imaging, CWI, 1098 XG, Amsterdam, The Netherlands. adriaan.graas@cwi.nl., Coban SB; Computational Imaging, CWI, 1098 XG, Amsterdam, The Netherlands.; Frazer-Nash Consultancy, Leatherhead, KT22 7NL, Surrey, UK., Batenburg KJ; Computational Imaging, CWI, 1098 XG, Amsterdam, The Netherlands.; Leiden Institute of Advanced Computer Science, Leiden University, Niels Bohrweg 1, 2333 CA, Leiden, The Netherlands., Lucka F; Computational Imaging, CWI, 1098 XG, Amsterdam, The Netherlands. felix.lucka@cwi.nl.
Publikováno v:
Scientific reports [Sci Rep] 2023 Nov 16; Vol. 13 (1), pp. 20070. Date of Electronic Publication: 2023 Nov 16.
Autor:
Sero D; Centrum Wiskunde & Informatica, Science Park 123, Amsterdam 1098 XG, Netherlands.; Conservation & Science, Rijksmuseum, Hobbemastraat 22, Amsterdam 1071 ZC, Netherlands., Garachon I; Conservation & Science, Rijksmuseum, Hobbemastraat 22, Amsterdam 1071 ZC, Netherlands., Hermens E; Hamilton Kerr Institute & Conservation and Science Division, Fitzwilliam Museum, University of Cambridge, Cambridge, UK., Batenburg KJ; Leiden Institute of Advanced Computer Science, Niels Bohrweg 1, Leiden 2333 CA, Netherlands.
Publikováno v:
Science advances [Sci Adv] 2023 Sep 22; Vol. 9 (38), pp. eadg6073. Date of Electronic Publication: 2023 Sep 20.
Autor:
Kiss MB; Centrum Wiskunde & Informatica, Computational Imaging group, Amsterdam, 1098 XG, The Netherlands. maximilian.kiss@cwi.nl., Coban SB; Centrum Wiskunde & Informatica, Computational Imaging group, Amsterdam, 1098 XG, The Netherlands.; Department of Mathematics, University of Manchester, Oxford Road, Manchester, M13 9PL, United Kingdom., Batenburg KJ; Centrum Wiskunde & Informatica, Computational Imaging group, Amsterdam, 1098 XG, The Netherlands.; Leiden University, LIACS, Leiden, 2300 RA, The Netherlands., van Leeuwen T; Centrum Wiskunde & Informatica, Computational Imaging group, Amsterdam, 1098 XG, The Netherlands.; Utrecht University, Mathematical Institute, Utrecht, 3584 CD, The Netherlands., Lucka F; Centrum Wiskunde & Informatica, Computational Imaging group, Amsterdam, 1098 XG, The Netherlands. felix.lucka@cwi.nl.
Publikováno v:
Scientific data [Sci Data] 2023 Sep 04; Vol. 10 (1), pp. 576. Date of Electronic Publication: 2023 Sep 04.
Autor:
Craig TM; Electron Microscopy for Materials Science and NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium. sara.bals@uantwerpen.be., Kadu AA; Electron Microscopy for Materials Science and NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium. sara.bals@uantwerpen.be.; Centrum Wiskunde & Informatica, Science Park 123, Amsterdam 1098 XG, The Netherlands., Batenburg KJ; Centrum Wiskunde & Informatica, Science Park 123, Amsterdam 1098 XG, The Netherlands.; Leiden Institute of Advanced Computer Science, Leiden University, Niels Bohrweg 1, 2333CA Leiden, The Netherlands., Bals S; Electron Microscopy for Materials Science and NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium. sara.bals@uantwerpen.be.
Publikováno v:
Nanoscale [Nanoscale] 2023 Mar 16; Vol. 15 (11), pp. 5391-5402. Date of Electronic Publication: 2023 Mar 16.
Autor:
Skorikov A; EMAT and NANOlab Center of Excellence, University of Antwerp, Antwerp, Belgium.; Computational Imaging group, Centrum Wiskunde & Informatica (CWI), Amsterdam, The Netherlands., Batenburg KJ; Computational Imaging group, Centrum Wiskunde & Informatica (CWI), Amsterdam, The Netherlands.; Leiden Institute of Advanced Computer Science (LIACS), Leiden University, Leiden, The Netherlands., Bals S; EMAT and NANOlab Center of Excellence, University of Antwerp, Antwerp, Belgium.
Publikováno v:
Journal of microscopy [J Microsc] 2023 Mar; Vol. 289 (3), pp. 157-163. Date of Electronic Publication: 2023 Jan 09.