Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Baryshev, V. I."'
Autor:
Gareev, A M, Belan, L N, Goryachev, V S, Farkhutdinov, A M, Baryshev, V I, Shevchenko, A M, Ostrovskaya, Yu V, Gainanshin, M F
Publikováno v:
IOP Conference Series: Earth & Environmental Science; 2021, Vol. 834, p1-8, 8p
Autor:
Baryshev, V. I., Laiko, K. K.
Рассмотрены причины и последствия снижения прочности жидкости. Приведен краткий аналитический обзор экспериментальных работ по описа
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2425::eeb05a6c205b14529c71762e70ef355e
http://dspace.susu.ac.ru/xmlui/handle/0001.74/4693
http://dspace.susu.ac.ru/xmlui/handle/0001.74/4693
Autor:
Baryshev, V I, Bogatov, Alexandr P, Duraev, V P, Eliseev, P G, Luk'yanov, S A, Rakhval'skiĭ, M P
Publikováno v:
Soviet Journal of Quantum Electronics; Sep1990, Vol. 20 Issue 9, p1057-1059, 3p
Autor:
Spivak, A. A.1 (AUTHOR) aaspivak100@gmail.com, Rybnov, Yu. S.1 (AUTHOR), Riabova, S. A.1 (AUTHOR)
Publikováno v:
Doklady Earth Sciences. May2022, Vol. 504 Issue 1, p291-295. 5p.
Autor:
Spivak, A. A.1 (AUTHOR) aaspivak100@gmail.com, Riabova, S. A.1 (AUTHOR)
Publikováno v:
Doklady Earth Sciences. Dec2021, Vol. 501 Issue 1, pS22-S26. 5p.
Autor:
Riabova, S. A.1 (AUTHOR) riabovasa@mail.ru, Spivak, A. A.1 (AUTHOR)
Publikováno v:
Doklady Earth Sciences. Mar2021, Vol. 497 Issue 1, p246-251. 6p.
Autor:
Riabova, S. A.1 (AUTHOR) riabovasa@mail.ru, Spivak, A. A.1 (AUTHOR)
Publikováno v:
Doklady Earth Sciences. 2020, Vol. 495 Issue 1, p835-840. 6p.
Autor:
Spivak, A. A.1 (AUTHOR) spivak@idg.chph.ras.ru, Riabova, S. A.1 (AUTHOR), Rybnov, Y. S.1 (AUTHOR), Kharlamov, V. A.1 (AUTHOR)
Publikováno v:
Doklady Earth Sciences. Mar2020, Vol. 491 Issue 1, p155-159. 5p.
Autor:
Kuznetsov, A. A., Baryshev, V. I.
Publikováno v:
Measurement Techniques; August 1979, Vol. 22 Issue: 8 p977-978, 2p
Autor:
Baryshev, V. I., Golikova, E. G., Duraev, V. P., Kuchinskiĭ, V. I., Kizhaev, K. Yu, Kuksenkov, D. V., Portnoĭ, E. L., Smirnitskiĭ, V. B.
Publikováno v:
Soviet Journal of Quantum Electronics; 1988, Vol. 18 Issue 11, p1-1, 1p