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pro vyhledávání: '"Bartosz C. Pruchnik"'
Autor:
Bartosz C. Pruchnik, Janusz D. Fidelus, Ewelina Gacka, Krzysztof Kwoka, Julia Pruchnik, Adrianna Piejko, Łukasz Usydus, Leszek Zaraska, Grzegorz D. Sulka, Tomasz Piasecki, Teodor P. Gotszalk
Publikováno v:
Nanomaterials, Vol 13, Iss 17, p 2451 (2023)
The measurement method, which utilizes nanomanipulation of the nanowires onto a specially prepared substrate, was presented. It introduced a four-point resistance measurement setup on a chip suited for scanning probe microscopy measurements, integrat
Externí odkaz:
https://doaj.org/article/6c1c486560fe44699e01fefbf953484c
