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pro vyhledávání: '"Bart Kerckhof"'
Autor:
Martin Bleicher, Walter E. Mueller-von Fischer, Helge Schmidt, Bart Kerckhof, Frank Schabert, Claus Borhauer, Thomas Fili, Jorge Villarreal, Erika R. Crandall, Stefan Thoss
Publikováno v:
2017 IEEE Holm Conference on Electrical Contacts.
Due to restrictions on lead usage often resulting in the use of pure tin deposits, coupled with global miniaturization, the unpredictable risks of Sn whisker growth rises, especially in highly stressed coating applications. The ability to prevent whi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::65b89bb0c073b23cada9b054c8a1851a
https://doi.org/10.1109/holm.2017.8088075
https://doi.org/10.1109/holm.2017.8088075
