Výsledky vyhledávání - "Barry, John D"

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Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope

Autor: Imtiaz, Atif, Anlage, Steven M., Barry, John D., Melngailis, John

Publikováno v: Appl. Phys. Lett. 90, 143106 (2007)

We report topography-free materials contrast imaging on a nano-fabricated Boron-doped Silicon sample measured with a Near-field Scanning Microwave Microscope over a broad frequency range. The Boron doping was performed using the Focus Ion Beam techni

Externí odkaz: http://arxiv.org/abs/cond-mat/0703241

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Near-Field Microwave Microscopy on nanometer length scales

Autor: Imtiaz, Atif, Pollak, Marc, Anlage, Steven M, Barry, John D, Melngailis, John

Publikováno v: J. Appl. Phys. 97, 044302 (2005).

The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample interaction for the NSMM. We observe that this length scale plays an import

Externí odkaz: http://arxiv.org/abs/cond-mat/0408218

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