Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Barr MKS"'
Autor:
Hu H; Materials for Electronics and Energy Technology (i-MEET), Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Martensstraße 7, 91058 Erlangen, Germany.; Erlangen Graduate School in Advanced Optical Technologies (SAOT), Paul-Gordan-Street 6, 91052 Erlangen, Germany., Fehn D; Department of Chemistry and Pharmacy, Inorganic Chemistry, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Egerlandstraße 1, 91058 Erlangen, Germany., Barr MKS; Department of Chemistry and Pharmacy, Institute of Chemistry of Thin Film Materials, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Cauerstraße 3, 91058 Erlangen, Germany., Harreiss C; Department of Materials Science and Engineering, Institute of Micro- and Nanostructure Research, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Cauerstraße 3, 91058 Erlangen, Germany., Zhao Y; State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Electronic Science and Engineering, University of Electronic Science and Technology of China (UESTC), 611731 Chengdu, P. R. China., Meyer K; Department of Chemistry and Pharmacy, Inorganic Chemistry, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Egerlandstraße 1, 91058 Erlangen, Germany., Spiecker E; Department of Materials Science and Engineering, Institute of Micro- and Nanostructure Research, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Cauerstraße 3, 91058 Erlangen, Germany., Bachmann J; Department of Chemistry and Pharmacy, Institute of Chemistry of Thin Film Materials, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Cauerstraße 3, 91058 Erlangen, Germany., Osvet A; Materials for Electronics and Energy Technology (i-MEET), Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Martensstraße 7, 91058 Erlangen, Germany., Brabec CJ; Materials for Electronics and Energy Technology (i-MEET), Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Martensstraße 7, 91058 Erlangen, Germany.; Helmholtz-Institut Erlangen- Nürnberg, Immerwahrstraße 2, 91058 Erlangen, Germany.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 Apr 26. Date of Electronic Publication: 2024 Apr 26.
Autor:
Hu H; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Materials for Electronics and Energy Technology (i-MEET), Martensstraße 7, 91058 Erlangen, Germany.; Erlangen Graduate School in Advanced Optical Technologies (SAOT), Paul-Gordan-Street 6, 91052 Erlangen, Germany., Fehn D; Department of Chemistry and Pharmacy, Inorganic Chemistry, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Egerlandstraße 1, 91058 Erlangen, Germany., Barr MKS; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Department of Chemistry and Pharmacy, Institute of Chemistry of Thin Film Materials, Cauerstraße 3, 91058 Erlangen, Germany., Harreiss C; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Department of Materials Science and Engineering, Institute of Micro- and Nanostructure Research, Cauerstraße 3, 91058 Erlangen, Germany., Zhao Y; State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Electronic Science and Engineering, University of Electronic Science and Technology of China (UESTC), 611731 Chengdu, P. R. China., Meyer K; Department of Chemistry and Pharmacy, Inorganic Chemistry, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Egerlandstraße 1, 91058 Erlangen, Germany., Osvet A; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Materials for Electronics and Energy Technology (i-MEET), Martensstraße 7, 91058 Erlangen, Germany., Brabec CJ; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Materials for Electronics and Energy Technology (i-MEET), Martensstraße 7, 91058 Erlangen, Germany.; Helmholtz-Institut Erlangen-Nürnberg, Immerwahrstraße 2, 91058 Erlangen, Germany.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 Apr 10; Vol. 16 (14), pp. 17946-17953. Date of Electronic Publication: 2024 Mar 21.
Autor:
Stefanovic S; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, Cauerstraße 3, 91058, Erlangen, Germany., Gheshlaghi N; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, Cauerstraße 3, 91058, Erlangen, Germany., Zanders D; Inorganic Materials Chemistry, Ruhr-Universität Bochum, Universitätsstraße 150, 44801, Bochum, Germany., Kundrata I; ATLANT 3D Nanosystems ApS Mårkaervej 2, DK-2630 Taastrup, Mårkaervej 2, Taastrup, DK-2630, Denmark., Zhao B; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, Cauerstraße 3, 91058, Erlangen, Germany.; Friedrich-Alexander-Universität Erlangen-Nürnberg, Organic Materials and Devices, IZNF, Cauerstraße 3, 91058, Erlangen, Germany., Barr MKS; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, Cauerstraße 3, 91058, Erlangen, Germany., Halik M; Friedrich-Alexander-Universität Erlangen-Nürnberg, Organic Materials and Devices, IZNF, Cauerstraße 3, 91058, Erlangen, Germany., Devi A; Inorganic Materials Chemistry, Ruhr-Universität Bochum, Universitätsstraße 150, 44801, Bochum, Germany., Bachmann J; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, Cauerstraße 3, 91058, Erlangen, Germany.; ATLANT 3D Nanosystems ApS Mårkaervej 2, DK-2630 Taastrup, Mårkaervej 2, Taastrup, DK-2630, Denmark.
Publikováno v:
Small (Weinheim an der Bergstrasse, Germany) [Small] 2023 Sep; Vol. 19 (36), pp. e2301774. Date of Electronic Publication: 2023 May 01.
Autor:
Hilpert F; Interface Research and Catalysis, Erlangen Center for Interface Research and Catalysis, Friedrich-Alexander-Universität Erlangen-Nürnberg, Egerlandstraße 3, 91058 Erlangen, Germany., Liao PC; Chemistry of Thin Film Materials (CTFM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstraße 3, 91058 Erlangen, Germany., Franz E; Interface Research and Catalysis, Erlangen Center for Interface Research and Catalysis, Friedrich-Alexander-Universität Erlangen-Nürnberg, Egerlandstraße 3, 91058 Erlangen, Germany., Koch VM; Chemistry of Thin Film Materials (CTFM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstraße 3, 91058 Erlangen, Germany., Fromm L; Lehrstuhl für Theoretische Chemie, Friedrich-Alexander-Universität Erlangen-Nürnberg, Egerlandstraße 3, 91058 Erlangen, Germany., Topraksal E; PULS Group Physik Department, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstraße 3, 91058 Erlangen, Germany.; Germany Group for Computational Life Sciences, Division of Physical Chemistry, Ruđer Bos̆ković Institute, 10000 Zagreb, Croatia., Görling A; Lehrstuhl für Theoretische Chemie, Friedrich-Alexander-Universität Erlangen-Nürnberg, Egerlandstraße 3, 91058 Erlangen, Germany., Smith AA; PULS Group Physik Department, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstraße 3, 91058 Erlangen, Germany.; Germany Group for Computational Life Sciences, Division of Physical Chemistry, Ruđer Bos̆ković Institute, 10000 Zagreb, Croatia., Barr MKS; Chemistry of Thin Film Materials (CTFM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstraße 3, 91058 Erlangen, Germany., Bachmann J; Chemistry of Thin Film Materials (CTFM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstraße 3, 91058 Erlangen, Germany., Brummel O; Interface Research and Catalysis, Erlangen Center for Interface Research and Catalysis, Friedrich-Alexander-Universität Erlangen-Nürnberg, Egerlandstraße 3, 91058 Erlangen, Germany., Libuda J; Interface Research and Catalysis, Erlangen Center for Interface Research and Catalysis, Friedrich-Alexander-Universität Erlangen-Nürnberg, Egerlandstraße 3, 91058 Erlangen, Germany.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2023 Apr 19; Vol. 15 (15), pp. 19536-19544. Date of Electronic Publication: 2023 Apr 05.
Autor:
Barr MKS; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chair Chemistry of Thin Film Materials, IZNF, Cauerstr. 3, 91058 Erlangen, Germany., Nadiri S; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chair Chemistry of Thin Film Materials, IZNF, Cauerstr. 3, 91058 Erlangen, Germany., Chen DH; Karlsruhe Institute of Technology, Institute of Functional Interfaces (IFG), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany., Weidler PG; Karlsruhe Institute of Technology, Institute of Functional Interfaces (IFG), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany., Bochmann S; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chair Chemistry of Thin Film Materials, IZNF, Cauerstr. 3, 91058 Erlangen, Germany., Baumgart H; Department of Electrical and Computer Engineering, Old Dominion University, Norfolk, Virginia 23529, United States.; Applied Research Center at Jefferson Labs, Newport News, Virginia 23606, United States., Bachmann J; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chair Chemistry of Thin Film Materials, IZNF, Cauerstr. 3, 91058 Erlangen, Germany., Redel E; Karlsruhe Institute of Technology, Institute of Functional Interfaces (IFG), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany.
Publikováno v:
Chemistry of materials : a publication of the American Chemical Society [Chem Mater] 2022 Nov 22; Vol. 34 (22), pp. 9836-9843. Date of Electronic Publication: 2022 Nov 02.
Autor:
Kundrata I; ATLANT 3D Nanosystems, Kongens Lyngby, 2800, Denmark.; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, 91058, Erlangen, Germany.; Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, 841 04, Slovakia., Barr MKS; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, 91058, Erlangen, Germany., Tymek S; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, 91058, Erlangen, Germany., Döhler D; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, 91058, Erlangen, Germany., Hudec B; Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, 841 04, Slovakia., Brüner P; IONTOF GmbH, 48149, Münster, Germany., Vanko G; Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, 841 04, Slovakia., Precner M; Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, 841 04, Slovakia., Yokosawa T; Friedrich-Alexander University of Erlangen-Nürnberg, Chair of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, 91058, Erlangen, Germany., Spiecker E; Friedrich-Alexander University of Erlangen-Nürnberg, Chair of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, 91058, Erlangen, Germany., Plakhotnyuk M; ATLANT 3D Nanosystems, Kongens Lyngby, 2800, Denmark., Fröhlich K; Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, 841 04, Slovakia.; Center for Advanced Materials Application, Slovak Academy of Sciences, Bratislava, 845 11, Slovakia., Bachmann J; ATLANT 3D Nanosystems, Kongens Lyngby, 2800, Denmark.; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chemistry of Thin Film Materials, IZNF, 91058, Erlangen, Germany.
Publikováno v:
Small methods [Small Methods] 2022 May; Vol. 6 (5), pp. e2101546. Date of Electronic Publication: 2022 Mar 11.
Autor:
Müssig S; Department of Chemistry and Pharmacy, Friedrich-Alexander University ErlangenNürnberg (FAU), Egerlandstraße 1, 91058, Erlangen, Germany., Koch VM; Chair 'Chemistry of Thin Film Materials' (CTFM), Friedrich-Alexander University ErlangenNürnberg (FAU), IZNF, Cauerstraße 3, 91058, Erlangen, Germany., Collados Cuadrado C; Department of Chemical and Bioengineering, Institute of Separation Science and Technology, Friedrich-Alexander-University Erlangen-Nürnberg, Egerlandstr. 3, 91058, Erlangen, Germany., Bachmann J; Chair 'Chemistry of Thin Film Materials' (CTFM), Friedrich-Alexander University ErlangenNürnberg (FAU), IZNF, Cauerstraße 3, 91058, Erlangen, Germany.; Institute of Chemistry, Saint Petersburg State University, Universitetskii pr. 26, Saint Petersburg, 198504, Russian Federation., Thommes M; Department of Chemical and Bioengineering, Institute of Separation Science and Technology, Friedrich-Alexander-University Erlangen-Nürnberg, Egerlandstr. 3, 91058, Erlangen, Germany., Barr MKS; Chair 'Chemistry of Thin Film Materials' (CTFM), Friedrich-Alexander University ErlangenNürnberg (FAU), IZNF, Cauerstraße 3, 91058, Erlangen, Germany., Mandel K; Department of Chemistry and Pharmacy, Friedrich-Alexander University ErlangenNürnberg (FAU), Egerlandstraße 1, 91058, Erlangen, Germany.; Fraunhofer Institute for Silicate Research ISC, Neunerplatz 2, 97082, Würzburg, Germany.
Publikováno v:
Small methods [Small Methods] 2022 Jan; Vol. 6 (1), pp. e2101296. Date of Electronic Publication: 2021 Nov 21.
Autor:
Englhard J; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, IZNF, Friedrich-Alexander University of Erlangen-Nürnberg Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de., Cao Y; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, IZNF, Friedrich-Alexander University of Erlangen-Nürnberg Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de., Bochmann S; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, IZNF, Friedrich-Alexander University of Erlangen-Nürnberg Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de., Barr MKS; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, IZNF, Friedrich-Alexander University of Erlangen-Nürnberg Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de., Cadot S; C2P2 UMR 5265, Université de Lyon, Institut de Chimie de Lyon, CNRS, Université Lyon 1, ESCPE Lyon 43 Bd. du 11 Novembre 1918 69616 Villeurbanne France., Quadrelli EA; C2P2 UMR 5265, Université de Lyon, Institut de Chimie de Lyon, CNRS, Université Lyon 1, ESCPE Lyon 43 Bd. du 11 Novembre 1918 69616 Villeurbanne France., Bachmann J; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, IZNF, Friedrich-Alexander University of Erlangen-Nürnberg Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de.; Institute of Chemistry, Saint Petersburg State University Universitetskii pr. 26 198504 St. Petersburg Russia.
Publikováno v:
RSC advances [RSC Adv] 2021 May 18; Vol. 11 (29), pp. 17985-17992. Date of Electronic Publication: 2021 May 18.
Autor:
Zhuo Y; Friedrich-Alexander University of Erlangen-Nürnberg, Department of Chemistry and Pharmacy, Chemistry of Thin Film Materials, IZNF Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de., Tymek S; Friedrich-Alexander University of Erlangen-Nürnberg, Department of Chemistry and Pharmacy, Chemistry of Thin Film Materials, IZNF Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de., Sun H; Friedrich-Alexander University of Erlangen-Nürnberg, Department of Chemistry and Pharmacy, Chemistry of Thin Film Materials, IZNF Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de., Barr MKS; Friedrich-Alexander University of Erlangen-Nürnberg, Department of Chemistry and Pharmacy, Chemistry of Thin Film Materials, IZNF Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de.; Aix Marseille Univ., CNRS, CINaM Marseille France., Santinacci L; Aix Marseille Univ., CNRS, CINaM Marseille France., Bachmann J; Friedrich-Alexander University of Erlangen-Nürnberg, Department of Chemistry and Pharmacy, Chemistry of Thin Film Materials, IZNF Cauerstr. 3 91058 Erlangen Germany julien.bachmann@fau.de.; Saint Petersburg State University, Institute of Chemistry Universitetskii pr. 26 198504 Saint Petersburg Russian Federation.
Publikováno v:
Nanoscale advances [Nanoscale Adv] 2020 Feb 13; Vol. 2 (4), pp. 1417-1426. Date of Electronic Publication: 2020 Feb 13 (Print Publication: 2020).
Autor:
Büttner P; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, Friedrich-Alexander University Erlangen-Nürnberg, IZNF, Cauerstr. 3, Erlangen 91058, Germany., Scheler F; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, Friedrich-Alexander University Erlangen-Nürnberg, IZNF, Cauerstr. 3, Erlangen 91058, Germany., Pointer C; Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, Pennsylvania 18015, United States., Döhler D; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, Friedrich-Alexander University Erlangen-Nürnberg, IZNF, Cauerstr. 3, Erlangen 91058, Germany., Barr MKS; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, Friedrich-Alexander University Erlangen-Nürnberg, IZNF, Cauerstr. 3, Erlangen 91058, Germany., Koroleva A; Centre for Physical Methods of Surface Investigation, St. Petersburg State University, St. Petersburg 198504, Russia., Pankin D; Centre for Optical and Laser Materials Research, St. Petersburg State University, St. Petersburg 199034, Russia., Hatada R; Materials Analysis, Department of Materials Science, Technische Universität Darmstadt, Alarich-Weiss-Str. 2, Darmstadt 64287, Germany., Flege S; Materials Analysis, Department of Materials Science, Technische Universität Darmstadt, Alarich-Weiss-Str. 2, Darmstadt 64287, Germany., Manshina A; Institute of Chemistry, Saint-Petersburg State University, Universitetskii pr. 26, St. Petersburg 198504, Russia., Young ER; Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, Pennsylvania 18015, United States., Mínguez-Bacho I; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, Friedrich-Alexander University Erlangen-Nürnberg, IZNF, Cauerstr. 3, Erlangen 91058, Germany., Bachmann J; Chemistry of Thin Film Materials, Department of Chemistry and Pharmacy, Friedrich-Alexander University Erlangen-Nürnberg, IZNF, Cauerstr. 3, Erlangen 91058, Germany.; Institute of Chemistry, Saint-Petersburg State University, Universitetskii pr. 26, St. Petersburg 198504, Russia.
Publikováno v:
ACS applied energy materials [ACS Appl Energy Mater] 2019 Dec 23; Vol. 2 (12), pp. 8747-8756. Date of Electronic Publication: 2019 Dec 10.