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pro vyhledávání: '"Barr, A. R."'
Two-dimensional (2D) semiconductors are likely to dominate next-generation electronics due to their advantages in compactness and low power consumption. However, challenges such as high contact resistance and inefficient doping hinder their applicabi
Externí odkaz:
http://arxiv.org/abs/2410.07439
Autor:
Arora, Raagya, Barr, Ariel R., Bennett, Daniel, Larson, Daniel T., Pizzochero, Michele, Kaxiras, Efthimios
Ultra-wide bandgap (UWBG) semiconductors are poised to transform power electronics by surpassing the capabilities of established wide bandgap materials, such as GaN and SiC, owing to their capability to operate at higher voltage, frequency, and tempe
Externí odkaz:
http://arxiv.org/abs/2405.08966
Autor:
Barr, Karlen R.1,2 (AUTHOR), Hawker, Patrick2 (AUTHOR), Winata, Teresa2,3,4 (AUTHOR), Wang, Si5 (AUTHOR), Smead, Melissa6 (AUTHOR), Ignatius, Hilda7 (AUTHOR), Kohlhoff, Jane2,8 (AUTHOR), Schmied, Virginia9 (AUTHOR), Jalaludin, Bin7,10 (AUTHOR), Lawson, Kenny11 (AUTHOR), Liaw, Siaw-Teng12,13 (AUTHOR), Lingam, Raghu13 (AUTHOR), Page, Andrew14 (AUTHOR), Lam-Cassettari, Christa1,2 (AUTHOR), Boydell, Katherine2,15 (AUTHOR), Lin, Ping-I1,2 (AUTHOR), Katz, Ilan16 (AUTHOR), Dadich, Ann11 (AUTHOR), Raman, Shanti7 (AUTHOR), Grace, Rebekah17 (AUTHOR)
Publikováno v:
BMC Health Services Research. 8/24/2024, Vol. 24 Issue 1, p1-15. 15p.
We describe a workflow used to analyze the source code of the {\sc Android OS kernel} and rate for a particular kind of bugginess that exposes a program to hacking. The workflow represents a novel approach for components' vulnerability rating. The ap
Externí odkaz:
http://arxiv.org/abs/2112.11214
It's regarded as an axiom that a good model is one that compromises between bias and variance. The bias is measured in training cost, while the variance of a (say, regression) model is measure by the cost associated with a validation set. If reducing
Externí odkaz:
http://arxiv.org/abs/2110.02490
Autor:
Branham, Paul J., Cooper, Hans C., Williamson, Yulanda M., Najjar, Fabio N., Sutton, William J.H., Pierce-Ruiz, Carrie L., Barr, John R., Williams, Tracie L.
Publikováno v:
In Biologicals February 2024 85
Autor:
Crozier, Lisa, Foy, Reece, Adib, Rozita, Kar, Ananya, Holt, Jordan A., Pareri, Aanchal U., Valverde, Juan M., Rivera, Rene, Weston, William A., Wilson, Rona, Regnault, Clement, Whitfield, Phil, Badonyi, Mihaly, Bennett, Laura G., Vernon, Ellen G., Gamble, Amelia, Marsh, Joseph A., Staples, Christopher J., Saurin, Adrian T., Barr, Alexis R., Ly, Tony
Publikováno v:
In Molecular Cell 16 November 2023 83(22):4062-4077
Autor:
Sutton, William J.H., Branham, Paul J., Williamson, Yulanda M., Cooper, Hans C., Najjar, Fabio N., Pierce-Ruiz, Carrie L., Barr, John R., Williams, Tracie L.
Publikováno v:
In Vaccine 13 June 2023 41(26):3872-3884
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