Výsledky vyhledávání - "Barondeau, Olivier"

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Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality

Autor: Beck, Matthias, Barondeau, Olivier, Kaibel, Martin, Poehl, Frank, Lin, Xijiang, Press, Ron

Publikováno v: Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)

This paper addresses delay test for SOC devices with high frequency clock domains. A logic design for on-chip high-speed clock generation, implemented to avoid expensive test equipment, is described in detail. Techniques for on-chip clock generation,

Externí odkaz: http://arxiv.org/abs/0710.4763

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Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality.

Autor: Beck, Matthias, Barondeau, Olivier, Kaibel, Martin, Poehl, Frank, Lin, Xijiang, Press, Ron

Publikováno v: Proceedings of the Conference: Design, Automation & Test in Europe; 3/7/2005, Vol. 1, p56-61, 6p

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