Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Bannenberg LJ"'
Autor:
Nespoli J; Department of Chemical Engineering, Faculty of Applied Sciences, Delft University of Technology, 2629 HZ Delft, The Netherlands., Mugge M; Department of Chemical Engineering, Faculty of Applied Sciences, Delft University of Technology, 2629 HZ Delft, The Netherlands., van der Poll LM; Department of Chemical Engineering, Faculty of Applied Sciences, Delft University of Technology, 2629 HZ Delft, The Netherlands., Lal S; Department of Chemical Engineering, Faculty of Applied Sciences, Delft University of Technology, 2629 HZ Delft, The Netherlands., Ibrahim B; Department of Chemical Engineering, Faculty of Applied Sciences, Delft University of Technology, 2629 HZ Delft, The Netherlands., Boshuizen B; Department of Chemical Engineering, Faculty of Applied Sciences, Delft University of Technology, 2629 HZ Delft, The Netherlands., Caselli VM; Department of Chemical Engineering, Faculty of Applied Sciences, Delft University of Technology, 2629 HZ Delft, The Netherlands., Houtepen AJ; Department of Chemical Engineering, Faculty of Applied Sciences, Delft University of Technology, 2629 HZ Delft, The Netherlands., Bannenberg LJ; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, 2629 JB Delft, The Netherlands., Savenije TJ; Department of Chemical Engineering, Faculty of Applied Sciences, Delft University of Technology, 2629 HZ Delft, The Netherlands.
Publikováno v:
Journal of the American Chemical Society [J Am Chem Soc] 2024 Nov 13; Vol. 146 (45), pp. 30860-30870. Date of Electronic Publication: 2024 Nov 04.
Autor:
Bannenberg LJ; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, JB Delft 2629, The Netherlands., Veeneman IM; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, JB Delft 2629, The Netherlands., Straus FIB; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, JB Delft 2629, The Netherlands., Chen HY; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, JB Delft 2629, The Netherlands., Kinane CJ; ISIS Neutron Source, Rutherford Appleton Laboratory, STFC, UKRI, Didcot OX11 0S8X, United Kingdom., Hall S; ISIS Neutron Source, Rutherford Appleton Laboratory, STFC, UKRI, Didcot OX11 0S8X, United Kingdom., Thijs MA; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, JB Delft 2629, The Netherlands., Schreuders H; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, JB Delft 2629, The Netherlands.
Publikováno v:
ACS omega [ACS Omega] 2024 Sep 26; Vol. 9 (40), pp. 41978-41989. Date of Electronic Publication: 2024 Sep 26 (Print Publication: 2024).
Autor:
Libraro S; Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Electrical and Microengineering (IEM), Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Maladière 71b, 2000 Neuchâtel, Switzerland., Bannenberg LJ; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, 2629JB Delft, The Netherlands., Famprikis T; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, 2629JB Delft, The Netherlands., Reyes D; Interdisciplinary Centre for Electron Microscopy, EPFL, 1015 Lausanne, Switzerland., Hurni J; Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Electrical and Microengineering (IEM), Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Maladière 71b, 2000 Neuchâtel, Switzerland., Genc E; Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Electrical and Microengineering (IEM), Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Maladière 71b, 2000 Neuchâtel, Switzerland., Ballif C; Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Electrical and Microengineering (IEM), Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Maladière 71b, 2000 Neuchâtel, Switzerland.; CSEM Sustainable Energy Center, Jaquet-Droz 1, 2002 Neuchâtel, Switzerland., Hessler-Wyser A; Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Electrical and Microengineering (IEM), Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Maladière 71b, 2000 Neuchâtel, Switzerland., Haug FJ; Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Electrical and Microengineering (IEM), Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Maladière 71b, 2000 Neuchâtel, Switzerland., Morisset A; Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Electrical and Microengineering (IEM), Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Maladière 71b, 2000 Neuchâtel, Switzerland.; CSEM Sustainable Energy Center, Jaquet-Droz 1, 2002 Neuchâtel, Switzerland.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 Sep 11; Vol. 16 (36), pp. 47931-47943. Date of Electronic Publication: 2024 Aug 30.
Autor:
Zhang S; Section Storage of Electrochemical Energy, Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JB Delft, Netherlands., Li Y; Shenzhen Key Laboratory of Power Battery Safety and Shenzhen Geim Graphene Center, Tsinghua Shenzhen International Graduate School, Tsinghua University, Guangdong 518055, China., Bannenberg LJ; Section Storage of Electrochemical Energy, Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JB Delft, Netherlands., Liu M; Shenzhen Key Laboratory of Power Battery Safety and Shenzhen Geim Graphene Center, Tsinghua Shenzhen International Graduate School, Tsinghua University, Guangdong 518055, China., Ganapathy S; Section Storage of Electrochemical Energy, Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JB Delft, Netherlands., Wagemaker M; Section Storage of Electrochemical Energy, Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JB Delft, Netherlands.
Publikováno v:
Science advances [Sci Adv] 2024 Jan 19; Vol. 10 (3), pp. eadj8889. Date of Electronic Publication: 2024 Jan 17.
Autor:
Bannenberg LJ, Bresser R, van der Ende P, van Exter M, van Goozen W, Naastepad F, Thijs MA, Verleg MN, de Vroege K, Waaijer R, van Well AA
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2023 Nov 01; Vol. 94 (11).
Autor:
Guo R; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Delft, 2629JB, The Netherlands.; Key Laboratory of Applied Surface and Colloid Chemistry, MOE, Shaanxi Engineering Lab for Advanced Energy Technology, Shaanxi Key Laboratory for Advanced Energy Devices, School of Materials Science and Engineering, Shaanxi Normal University, Xi'an, Shaanxi, 710119, China., Chen C; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Delft, 2629JB, The Netherlands., Bannenberg LJ; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Delft, 2629JB, The Netherlands., Wang H; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Delft, 2629JB, The Netherlands.; State Key Laboratory for Modification of Chemical Fibers and Polymer Materials, College of Materials Science and Engineering, Donghua University, Shanghai, 201620, China., Liu H; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Delft, 2629JB, The Netherlands., Yu M; Faculty of Chemistry and Food Chemistry, Center for Advancing Electronics Dresden Technische Universität Dresden Modulgebäude, 01217, Dresden, Germany., Sofer Z; Institute of Chemical Technology, University of Chemistry and Technology Prague, Prague 6, 16628, Czech Republic., Lei Z; Key Laboratory of Applied Surface and Colloid Chemistry, MOE, Shaanxi Engineering Lab for Advanced Energy Technology, Shaanxi Key Laboratory for Advanced Energy Devices, School of Materials Science and Engineering, Shaanxi Normal University, Xi'an, Shaanxi, 710119, China., Wang X; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Delft, 2629JB, The Netherlands.
Publikováno v:
Small methods [Small Methods] 2023 Aug; Vol. 7 (8), pp. e2201683. Date of Electronic Publication: 2023 Mar 18.
Autor:
Bannenberg LJ; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JBDelft, The Netherlands., Schreuders H; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JBDelft, The Netherlands., van Beugen N; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JBDelft, The Netherlands., Kinane C; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JBDelft, The Netherlands., Hall S; ISIS Neutron Source, Rutherford Appleton Laboratory, STFC, UKRI, OX11 0QXDidcot, United Kingdom., Dam B; Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JBDelft, The Netherlands.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2023 Feb 15; Vol. 15 (6), pp. 8033-8045. Date of Electronic Publication: 2023 Feb 03.
Autor:
Landgraf V; Faculty of Applied Sciences, Delft University of Technology, 2628 Delft, The Netherlands., Famprikis T; Faculty of Applied Sciences, Delft University of Technology, 2628 Delft, The Netherlands., de Leeuw J; Faculty of Applied Sciences, Delft University of Technology, 2628 Delft, The Netherlands., Bannenberg LJ; Faculty of Applied Sciences, Delft University of Technology, 2628 Delft, The Netherlands., Ganapathy S; Faculty of Applied Sciences, Delft University of Technology, 2628 Delft, The Netherlands., Wagemaker M; Faculty of Applied Sciences, Delft University of Technology, 2628 Delft, The Netherlands.
Publikováno v:
ACS applied energy materials [ACS Appl Energy Mater] 2023 Jan 27; Vol. 6 (3), pp. 1661-1672. Date of Electronic Publication: 2023 Jan 27 (Print Publication: 2023).
Autor:
Ghanbari E; Delft University of Technology, Delft2629 HZ, The Netherlands., Krishnamurthy A; Delft University of Technology, Delft2629 HZ, The Netherlands., Picken SJ; Delft University of Technology, Delft2629 HZ, The Netherlands., Klop EA; Teijin Aramid Research and Innovation Centre, P.O. Box 5153, 6802 EDArnhem, The Netherlands., Bannenberg LJ; Delft University of Technology, Delft2629 HZ, The Netherlands., van Esch J; Delft University of Technology, Delft2629 HZ, The Netherlands.
Publikováno v:
Langmuir : the ACS journal of surfaces and colloids [Langmuir] 2022 Dec 20; Vol. 38 (50), pp. 15782-15795. Date of Electronic Publication: 2022 Nov 23.
Autor:
Chaykina D, Usman I, Colombi G, Schreuders H, Tyburska-Pueschel B, Wu Z, Eijt SWH, Bannenberg LJ, de Wijs GA, Dam B
Publikováno v:
The journal of physical chemistry. C, Nanomaterials and interfaces [J Phys Chem C Nanomater Interfaces] 2022 Nov 03; Vol. 126 (43), pp. 18586. Date of Electronic Publication: 2022 Oct 24.