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of 3
pro vyhledávání: '"Balasubramania Murugan"'
Autor:
Larg Weiland, Hans Eisenmann, Amit Joag, Kelvin Doong, Scott Lin, Sa Zhao, Balasubramania Murugan, Christopher Hess
Publikováno v:
2014 International Conference on Microelectronic Test Structures (ICMTS).
Due to recent changes in the manufacturing of FEOL (front end of line) layers it is increasingly difficult to provide rapid learning cycles required to drive yield improvement during new product introduction (NPI). The Direct Probe Characterization V
Autor:
Hess, Christopher, Weiland, Larg, Joag, Amit, Murugan, Balasubramania, Zhao, Sa, Doong, Kelvin, Lin, Scott, Eisenmann, Hans
Publikováno v:
2014 International Conference on Microelectronic Test Structures (ICMTS); 2014, p219-223, 5p
Publikováno v:
2014 International Conference on Microelectronic Test Structures (ICMTS); 2014, pi-xii, 12p