Changes in Electrical Device Characteristics During the Formation of Dislocations [italic in situ] in the TEM

Autor: Ross, F.M., Bahnck, D., Bean, J.C., Peticolas, L.J., King, C.A., Kola, R.R.

Publikováno v: Ross, F.M.; Bahnck, D.; Bean, J.C.; Peticolas, L.J.; King, C.A.; & Kola, R.R.(1993). Changes in Electrical Device Characteristics During the Formation of Dislocations [italic in situ] in the TEM. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/98x2f5zt

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______325::9d76e34b6695a27e42510c3ab5faf975
http://www.escholarship.org/uc/item/98x2f5zt

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Changes in electrical device characteristics during the in situ formation of dislocations.

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