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pro vyhledávání: '"Baghel, Shanya"'
A Robust Bayesian approach for reliability prognosis of one-shot devices under cumulative risk model
Autor:
Baghel, Shanya, Mondal, Shuvashree
The reliability prognosis of one-shot devices is drawing increasing attention because of their wide applicability. The present study aims to determine the lifetime prognosis of highly durable one-shot device units under a step-stress accelerated life
Externí odkaz:
http://arxiv.org/abs/2406.08867
Autor:
Baghel, Shanya, Mondal, Shuvashree
This article aims at the lifetime prognosis of one-shot devices subject to competing causes of failure. Based on the failure count data recorded across several inspection times, statistical inference of the lifetime distribution is studied under the
Externí odkaz:
http://arxiv.org/abs/2307.12557
Autor:
Baghel, Shanya, Mondal, Shuvashree
In the literature, the reliability analysis of one-shot devices is found under accelerated life testing in the presence of various stress factors. The application of one-shot devices can be extended to the bio-medical field, where we often evidence t
Externí odkaz:
http://arxiv.org/abs/2211.00315
Autor:
Mondal, Shuvashree, Baghel, Shanya
Recently, a growing amount interest is quite evident in modelling dependent competing risks in life time prognosis problem. In this work, we propose to model the dependent competing risks by Marshal-Olkin bivariate exponential distribution. The obser
Externí odkaz:
http://arxiv.org/abs/2210.05911
Autor:
Baghel, Shanya, Mondal, Shuvashree
Publikováno v:
In Applied Mathematical Modelling February 2024 126:159-184
Akademický článek
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Autor:
Yadav, S. K.1 drskystats@gmail.com, Baghel, Shanya1
Publikováno v:
Investigación Operacional. 2021, Vol. 42 Issue 2, p279-293. 15p.
Publikováno v:
International Journal of Operational Research; 2023, Vol. 46 Issue: 4 p550-570, 21p
Publikováno v:
International Journal of Mathematical Modelling and Numerical Optimisation; 2021, Vol. 11 Issue: 3 p252-274, 23p