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A compact low-cost test equipment for thermal and electrical characterization of integrated circuits
Publikováno v:
In Measurement February 2009 42(2):281-289
Publikováno v:
In Microelectronics Journal October 2006 37(10):1128-1135
Autor:
Baderna, Davide1, Cabrini, Alessandro1 alessandro.cabrini@unipv.it, Torelli, Guido1 guido.torelli@unipv.it
Publikováno v:
IEEE Transactions on Instrumentation & Measurement. Jun2006, Vol. 55 Issue 3, p754-760. 7p. 3 Black and White Photographs, 2 Diagrams, 2 Charts, 3 Graphs.